The Only Portable XRF Scanner on the Market
高质量的定性分析
Key facts
布鲁克·埃里奥(Bruker Elio)易于操作,并揭示了您针对的物体的关键秘密。Bruker Elio的高价值对象是安全的。非接触式测量是无创的,并且完全无损。无需样品准备。
测量头和三脚架的轻重使该系统成为唯一真正的便携式X射线荧光(PXRF)光谱仪,具有市场上的映射功能和完美的旅行伴侣。
The alignment lasers identify the measurement point easily and ensure the correct and safe distance between sample and measurement head. High resolution optical images are recorded with an internal camera for each data point in addition to the XRF data.
The Bruker ELIO offers superior spectral quality with extremely low background which allows reliable qualitative trace element detection. The instrument can also be equipped with a He purging system to further extend the range of detectable elements as far as Na (Z = 11) to U (Z = 92). The Bruker ELIO micro-XRF spectrometer detects trace elements reliably thanks to the superior design of the electronics. The spectrometer can be equipped with several X-ray filters to optimize the excitation conditions for specific applications.
A spectrum or a map can be recorded with the ELIO software. The automatic peak ID provides a quick visual indication of elements in a sample. The interface shows the spectrum and the element concentration while the acquisition is running. Data interpretation is easy with the overlay of the optical images and the XRF data.
The powerful data processing software ESPRIT Reveal offers many options for the offline analysis.
"What is the composition of the paint? Is the paint typical for the artist or the time he lived in? Is there another layer of paint hidden below the surface?”
在艺术和保护以及身份验证方面,这些问题是焦点。但是该原理不仅限于绘画。在调查所有类型艺术品的起源时,这是一项关键技术。
为了分析元素的局部分布,您可以避免运输有价值的艺术品,例如绘画或历史文物到实验室。如果物体太重或太大的运输可能是不可行的,那么岩石绘画和洞穴绘画也是如此。Bruker Elio是唯一真正的便携式XRF(PXRF)扫描仪。该开放梁系统分析样品在现场无损地完成。
The Bruker ELIO can be used for point measurements or with the mapping option to retrieve the distribution of multiple elements at the same time on areas as large as 100 mm by 100 mm. Recording the XRF spectrum on an area this large is also termed macro-XRF or MA-XRF.
Excitation and filter option |
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分析范围 |
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Detection |
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扫描 |
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Collimation |
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尺寸及重量 |
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