AFM Training Courses
Learn from Bruker's AFM Experts
Join our AFM technical and applications experts for in-person courses in our east and west coast facilities. You will learn about AFM theory, practical applications, operational tips and tricks for a number of AFM techniques. Each course has a specialized focus or mode of operation. Most classes include both theory sessions and lab sessions over the course of three days. In the lab sessions, attendees can practice each technique on Bruker AFMs in our demonstration facilities and are invited to use their own samples. Upon request, students may also stay a fourth day to have more hands-on time in the lab.
While there is a charge for the courses, customers with Complete Care or Access Care service contracts are eligible for free tuition. Others under service contract should contact BrukerNSDServiceOrders@bruker.com for information about available discounts.
AFM Image Quality and PeakForce QNM™ Course
In this class, we will talk about image quality and PeakForceTMQuantitative Nanomechanical Mapping (QNM).
- Day 1: Image Qualitywill cover in-depth theory of contact mode, TappingMode, and PeakForce Tapping with ScanAsyst, along with a discussion on the advantages and disadvantages of each mode. This session will include instruction on how to optimize the AFM scanning parameters to improve image quality. This session will discuss common imaging artifacts; how to recognize artifacts and prevent them.
- Day 2: PeakForce QNMwill discuss the theory, procedure, and offline analysis of force curves, including various contact mechanics theories for material modulus measurement with AFM. This session also includes PeakForce QNM theory, detailed quanitative nanomechanical mapping calibration procedures, and techniques for improving PeakForce QNM accuracy.
- Day 3: Fluid Imagingwill talk about how to setup typical fluid experiments, and how to calibrate PeakForce QNM parameters in fluid.
Cost:$1500/person
Lunches provided. Students responsible for transportation and hotel expenses.
Date:Tuesday - Thursday May 24 - 26, 2022
Location:力量的圣芭芭拉分校Californa办公室
112 Robin Hill Road, Goleta, CA, 93117
Date:Tuesday - Thursday July 19-21, 2022
Location:Bruker's Billerica, Massachusetts Office
40 Manning Road, Billerica, MA, 01821
AFM Electrical Measurements Course
This class is focused on material’s electrical property measurements using atomic force microscopy.
Day 1: Kelvin Probe Force Microscopy
Day2: SCM & TUNA
Day3: Piezo Force Microscopy
Four different techniques will be discussed: Kelvin Probe Force Microscopy (KPFM), Scanning Capacitance Microscopy (SCM), Tunneling Current AFM (TUNA), and Piezo Response Force Microscopy (PFM). KPFM measures material work function as well as surface charge. SCM is one of the primary techniques for doping profile mapping in semiconductor industry. TUNA can measure material’s electrical conductivity with wide range of current from fA-uA. PFM is used to study piezo material on nanoscale.
Cost:$1500/person
Lunches provided. Students responsible for transportation and hotel expenses.
Date:Tuesday - Thursday September 13-15, 2022
Location:Bruker's Santa Barbara Office
112 Robin Hill Road, Goleta, CA, 93117