电子显微镜分析仪

QUANTAX EDS for SEM

分析挑战的解决方案 - EDS,用于SEM,FIB和EPMA

The Standard in Energy Dispersive Spectrometry

快速地。多才多艺的。需求很大。

Faits marquants

600
kcps
分析吞吐量
Best analysis speed
121
eV
Peak resolution
最佳能源分辨率用于光元素分析
4
联合EDS检测器
Maximize throughput using multiple detectors or detector arrays

EDS具有SEM,FIB和EPMA的SLIM线技术

Bruker再次在扫描电子显微镜的能量分散光谱法中设定了性能和功能标准。新一代Quartax Eds具有XFlash®6探测器系列的活性区域从10到100毫米2.

第6代提供了硬件和软件技术,可提供最快,最可靠的结果:

Save time -新的细线技术探测器,大面积SDD,多探测器控制和高性能脉冲处理使工作更快地完成

Save effort- Motorized detector movement and light weight design make detector handling easier

获得更精确的 -Best energy resolution provides the highest quality spectra for precise analysis

获得更多可靠性 -The world's most comprehensive atomic database ensures most dependable low energy peak identification

Gain more accuracy -定量最复杂的算法和无标准方法和基于标准方法的独特组合提供了最高的精度结果

Avantages

Make your Element Analysis more Efficient!

The combination of an individual microscope adaptation, unmatched speed and precision leads to the most powerful EDS system for any lab. This sytem includes spectral imaging, making micro and nano analysis no longer a challenge.

The XFlash®detector family also offers optimized solutions for TEM and STEM as well as the uniqueXFlash®FlatQUAD, a detector made to answer questions on tough samples.

Furthermore, the seamless integration of EDS together with EBSD, Micro-XRF and WDS in only one user interface ESPRIT provides the most comprehensive analysis platform for any SEM, FIB and EPMA.

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