Innova
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Innova
The compact Innova®原子力显微镜（AFM）以适度的成本为最苛刻的科学研究提供了应用灵活性。其独特的闭环扫描线性化系统可确保与开环操作的准确测量和噪声水平。集成，高分辨率的颜色光学器件，开放式阶段和软件实验选择器构成了快速和简单的每个新实验。Innova凭借其高度可定制的功能集，为高分辨率成像和物理，生活和物质科学研究中的广泛功能提供了最大的价值。
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Streamlined Design
从具有短的机械环和低热漂移的刚性显微镜阶段到超级噪声电子设备，Innova机电设计的所有方面都已优化。结果是高分辨率性能和闭环定位的独特组合。Innova使用Bruker专有的超噪声数字闭环扫描线性化，以在所有维度上进行精确测量，无论空气和液体中的尺寸，偏移，速度或旋转如何。
Patented Top-Down Optics
通过软件控制的光学变焦，Innova光学器件可提供广泛的放大范围，从而可以直接查看悬臂和样品，并以优于1微米分辨率的样品，以识别最小的样品特征并确保精确的探测位置。如果光学元件完全放置在保护仪盖中，则可以随时查看探针和样品，同时从环境中降低仪器。光学与显微镜的人体工程学整合也有助于尖端交换和激光比对的易度和准确性。用户可以简单地放入新的提示，然后将光学元件返回到位。预先对准的悬臂将始终保持关注。
Easy Sample Access
Innova provides excellent sample access, even when the microscope head is in place, without compromising the rigidity of the mechanical design. The physically open architecture offers greater flexibility for custom experiments, for example, by allowing the easy insertion of electrodes for electrical and electrochemical sample characterization.
Applications
Expand Your Applications with AFM Modes
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.
Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.
Innova Data Gallery
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Recent AFM Webinars
Témoignages
Hear What Our Customers Have to Say
We are extremely happy with the Bruker Innova AFM instrument. It is easy to operate and is very useful for both biophysics research and undergraduate biophysics teaching. Many students are using this instrument extensively, and they are getting some beautiful images of their samples.
