Featuring Unique PeakForce IR and IR EasyAlign Technology
SANTA BARBARA, Calif.--(BUSINESS WIRE)--
Brukertoday announced the release of its second-generationInspire™infrared (IR) nanocharacterization system, which features 10-nanometer spatial resolution infrared chemical mapping in an easy-to-use, laser-safe package. With IR EasyAlign™,Inspiresimplifies scattering scanning near-field optical microscopy (sSNOM), a powerful technique for identifying chemical composition at the nanoscale. For the first time, the highest resolution nanoscale chemical mapping now becomes widely accessible. The system expands upon Bruker’s exclusivePeakForce Tapping®technology to provide new information for graphene research, polymers, complex materials and thin films, instantly correlating chemical maps with sample properties, such as modulus, conductivity, and workfunction.Inspireaccomplishes all of this at the highest spatial resolution, making it an exceptionally powerful and versatile nanochemical characterization system.
This Smart News Release features multimedia. View the full release here:http://www.businesswire.com/news/home/20150630005209/en/
Bruker Inspire IR Nanocharacterization System (Photo: Business Wire).
“Inspire是第一个完全集成sSNOM解决吗n. That combined with its PeakForce Tapping capabilities will allow us to perform novel experiments right from the start,” said
Gilbert C. Walker, Professor of Chemistry at the
University of Toronto。“我很高兴合作伙伴
Brukerto expand the great potential of sSNOM as a versatile tool for broader scientific discovery.”
“Inspireis a nanoscale characterization system that extends atomic force microscopy into the chemical regime by providing 10-nanometer correlated infrared, mechanical and topographical information,” added
Steve Minne, Ph.D., General Manager of
Bruker'sAFM business. “This capability finally lets any researcher answer the fundamental question of ‘where is it?’, and now also ‘what is it?’ at the nanoscale.”
About Inspire
Inspireprovides infrared absorption and reflection chemical maps with a resolution only limited by the AFM tip radius, based on scattering scanning near-field optical microscopy.Inspire整合了所有要求的uired optics, detectors, and configurable sources, as well as AFM hardware into a complete, laser-safe package. The system ensures accurate and optimized data in all channels by providing decoupled, stable optical alignment that is independent of probe position, combined withScanAsyst®auto-optimization of the tip-sample interaction. The result is repeatable, expert-level data, without the need for alignment expertise. To expand the information available, theInspirecontrol integration enables the automated acquisition of hyperspectral image stacks, while Bruker’s exclusivePeakForce IR™instantly correlates the nanoscale chemical information with an expanding set of sample properties, including modulus, adhesion, conductivity, and workfunction. This full set of information is even accessible on samples not amenable to conventional contact and Tapping Mode-based approaches.
About
Bruker Corporation(NASDAQ: BRKR)
For more than 50 years,
Brukerhas enabled scientists to make breakthrough discoveries and develop new applications that improve the quality of human life. Bruker’s high-performance scientific research instruments and high-value analytical solutions enable scientists to explore life and materials at molecular, cellular and microscopic levels.
In close cooperation with our customers,
Brukeris enabling innovation, productivity and customer success in life science molecular research, in applied and pharma applications, in microscopy, nano-analysis and industrial applications, as well as in cell biology, preclinical imaging, clinical research, microbiology and molecular diagnostics. For more information, please visit://www.fatactor.com。
View source version on businesswire.com:http://www.businesswire.com/news/home/20150630005209/en/
Source:
Bruker Corporation