Semiconductor Solutions

X射线缺陷检查

X射线缺陷检查

Bruker缺陷检测系统使用X射线衍射成像(XRDI)来检测单晶底物上的晶体缺陷,例如裂纹,滑移,脱位和微管。我们的XRDI检查技术无需使用蚀刻酸。这些系统广泛用于检测Si晶片的裂缝,从而导致晶圆破裂并提高其他高价值基板(例如CDTE和SIC)的产量和质量。

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Bruker与我们的客户合作解决了现实世界中的应用程序问题。我们开发下一代技术,并帮助客户选择正确的系统和配件。在工具出售工具很久之后,这种合作伙伴关系继续通过培训和扩展服务。betway手机客户端下载

Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.

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