Petrology, Geochemistry and Rock Characterization

Visualization of major, minor and trace elements in a rock underpin our understanding of many geologic processes. Typically confined to the scale of thin sections or below, rapid characterization of geochemical zoning in larger samples provides additional context to further investigation, allowing more robust sub-sampling decisions for other analytical approaches, and potentially reducing the total number of samples analyzed by more expensive techniques. Bruker products that allow visualization of geochemistry include:

• M4 TORNADOmicro-XRF providing geochemical mapping of large samples and detection down to 10's of ppm, leading to accurate characterization of geochemical distribution in any solid sample, and quantification of bulk geochemistry through integration of map data.

• M4 TORNADO^PLUSis a micro-XRF optimized for enhanced light element detection, with large-area light element SDD detectors and capability for analysis under vacuum and a He atmosphere, allowing element detection down to C.

• XTrace–QUANTAXMicro-XRF，升级SEM以允许在同一仪器上进行跟踪元素分析。当与快速阶段（一种基于模块化的压电系统）结合使用时，可以使用Xtrace进行高速映射，直接安装在标准的SEM阶段上。

Advances in our understanding of geologic processes have demonstrated the need for, and benefits derived from, knowing the textural context of dateable minerals in rocks. Commonly the minerals used for geochronology are accessories – fine-grained and low abundance – leading to significant effort and resources expended on locating them in thin sections or mineral separates. Micro-XRF and SEM-based automated mineralogy solutions can speed up this process, correctly identifying minerals and placing them in their textural-mineralogical context.

• M4 TORNADOMicro-XRF允许对大型样品进行地球化学映射，从地球化学代理或直接应用Bruker的Amics自动化矿物学解决方案来提供矿物质分布

• AMICSfor scanning electron microscopes provides automated mineralogical mapping of thin sections and polished grain mounts, with focused detection of key minerals and compositional quantification for robust classification