OPTIMUS 2

Our new, augmented TKD solution builds on the unmatched performance of existing on-axis TKD through the addition of multiple new hardware options, accessories, and software features. Most important change is the release of OPTIMUS 2 detector head, a result of an ongoing collaboration with DTU Nanolab in Denmark. Its new imaging capability and its improved design combined with new and innovative software features will enable:

• 现场实验的新分析能力
• 达到比以前更好的空间分辨率
• superior data quality and data integrity
• 改善了用户体验
• major boost in productivity for certain applications
  

• OPTIMUS Vue screen with a Si diode at its center for Bright Field (BF)-like imaging
  
• Advanced alloys for minimized interference with e-beam
• 屏幕活动层结构中的其他新薄膜以提高信号质量
• Optimized screen frame design for an improved user experience
• OPTIMUS 2 will continue to be compatible with the standard TKD screen (without a center diode)

• Improved spatial resolutionthrough OPTIMUS Vue’s center diode, which provides the ideal conditions for optimizing beam focus and astigmatism settings before acquiring a TKD map.
• Near real-time visualization在SEM中使用新的ESPRIT TRM功能以进行时间分辨的测量，在SEM中的原位实验期间电子透明样品的透明样品。
• Improved data integrity– high quality and high detail BF-like images are ideal input-data into the image correlation algorithms used by the ESPRIT DriftCorrection feature. The resulting gains in drift correction accuracy will be particularly beneficial for TKD maps, where even a beam or sample drift of just a few tens of nanometers will create visible artifacts in the map.
• Productivity boost– BF-like images can be binarized using the new ESPRIT MaxYield feature and subsequently employed as masks for efficient mapping of regions of interest on sparse samples, like nanoparticles or nanorods.
• Convenience, efficiency & success在新的Esprit FIL TKD（完整浸入镜头TKD）的校准过程中，有史以来首次使用完整的浸入镜头模式的TKD映射，也称为超高分辨率（UHR）模式，某些电子柱的模式。