NanoWizard Sense+

Based on the proven NanoWizard technology, theNanoWizard Sense+delivers high performance measurements in air and liquid on samples ranging from single molecules, living cells and tissues to polymers and nanomaterials.

Thanks to its modular and flexible design,it can be easily upgraded to a full NanoWizard® 4 XP systemwith application-specific components and add-on features.

The NanoWizard family is renowned for its wide range of optional accessories, modes and features, providing the highest flexibility for all your applications.

Sample handling: The large standard sample volume (Ø140×18mm³) can be enhanced with specialized options, such as motorized positioning, StretchingStage for AFM on samples under mechanical load, Head-up Stage extension up to 14cm in Z for taller samples, and shuttle stage for high NA upright optics with BioMAT™.

Temperature control:High and low temperature options (e.g., unique CryoStage: -120°C up to 220°C), with and without perfusion or gas control.

Open access:Utmost versatility in experiment design, e.g., simultaneous use of micro-pipettes or electrical probes in contact with the sample with AFM.

Electrical measurements:Conductive AFM, KPM, EFM, MFM, STM, Piezoresponse microscopy, electrochemistry with temperature control and optics.

Mechanical measurements:Optimized Force Mapping, Contact Resonance imaging, NanoManipulation, NanoLithography and NanoIndentation. Advanced Force Spectroscopy for applications ranging from single molecule force spectroscopy to viscoelastic mechanics.

Optical integration perfected:NanoWizard afm无与伦比的optical integration. Thanks to its unique tip-scanning design, the system can be combined with advanced optics and used simultaneously with standard condensers and reflection microscopy, even through thin coverslips, and on all major inverted optical microscopes.

• Designed for high quality imaging in air and liquid with excellent resolution, lowest noise and maximum usabilitys
• Now with Bruker’s exclusive PeakForce Tapping as standard
• Unique tip-scanning design andpatented DirectOverlay™ 2 modeenable seamless integration with optical microscopy
• Comprehensive force measurements from single molecules to living cells
• New workflow-based user interfacefor ergonomics and ease of operation
• Outstanding flexibility with a broad range ofmodes and accessoriesfor the characterization of mechanical, electrical, optical, magnetic and chemical samples properties, including state-of-the-art FluidFM cantilevers for cell injection and manipulation
• Can be easily upgraded to a full NanoWizard® 4 XP AFM system

Standard Operating Modes

Imaging modes

• Contact mode with lateral force microscopy (LFM)
• Tapping Mode™ with PhaseImaging™

Force measurements

• Static and dynamic spectroscopy
• Advanced force mapping

Optional Modes

• NEW:PeakForce Tapping
• Higher harmonics imaging
• NEW:Contact resonance AFM
• Conductive AFM
• Kelvin Probe Microscopy
• MFM and EFM

• STM
• Electrical spectroscopy modes
• Piezoresponse Microscopy
  
• Electrochemistry with temperature control and optical microscopy
• NanoLithography
• NanoManipulation
• Nanoindentation
• Scanning Thermal AFM
• NEW:FluidFM® solution from Cytosurge
• ExperimentPlanner for designing a specific measurement workflow
• RampDesigner™ for custom designed clamp and ramp experiments
• ExperimentControl feature for remote experiment control
• NEW:DirectOverlay 2 for combined AFM and optical microscopy

Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. Bruker provides you with the right accessories to control your sample conditions and to perform successful experiments.