Innova-iris
하이라이트
Innova-iris
Innova-iris结合了行业领先的AFM性能和Bruker独家TERS探针，以提供世界上唯一的完整，保证的尖端增强的拉曼光谱（TERS）解决方案。它与Renishaw Invia Micro-Raman系统无缝融合，同时完全保留每个单独组件的功能。结果是用于相关的微观和纳米级属性映射的生产性且完全集成的平台，该平台将AFM应用的边界扩展到纳米光谱和纳米化学分析。
특징
Designed Specifically to Enable TERS
The publication record proves that an off-axis reflection geometry is the best solution for maximizing the light capture while fully accounting for tip-shadowing and polarization effects. The Innova-IRIS utilizes a novel optical architecture that accesses the tip-sample junction from the front side of the probe to provide an ideal optical path free of obstructions. The co-designed integration of the Bruker Innova sample-scanning AFM with the Renishaw inVia Micro-Raman System uniquely retains the optical "hot-spot" alignment during scanning to enable the stringent requirements for integrated TERS imaging. Tip integrity and positioning are preserved over the long signal integration times required for such sensitive research.
Correlation of Complementary Data
The Innova-IRIS integration with the Renishaw inVia fully preserves the uncompromised performance, power and flexibility of both the AFM and Raman microscopes. Each utilizes its own full-featured, realtime control and data analysis package. The result is a single integrated system that enables the correlation of complementary nanoscale topographic, thermal, electrical, and mechanical information.
응용
Optimized for TERS Applications
