高分辨率自动在线X射线检查(XRI)系统
On the leading edge of a new category of in-line transmissive inspection and metrology equipment, the X200 XRI system brings front-of-line semiconductor fab-like inspection to the backend manufacturing line. The system uses proprietary data collection architecture, industry-leading data processing, and innovative machine learning techniques to provide fully automatic, fast, 100% inspection and real-time feedback on user-defined regions of interest. Designed for continuous use on the manufacturing floor and able to inspect a range of semiconductor components—including singulated units, strips, boats, wafers, and film frames—the X200 provides the unique capabilities manufacturers need to meet increasingly stringent customer requirements and regulatory standards. The X200 XRI system is ideal for a range of semiconductor applications, from advanced packaging and system in a package (SiP) production to 2.5D and 3D integrated circuit chip (IC) integration and power component manufacturing.
With advanced instrumentation and proprietary system architecture and processing techniques, X200 enables uniquely precise quantification,功能表面特征,缺陷和变化的计算,位置和解释。该系统还提供了全面的数据和记录管理。
This is accomplished through:
Advances in semiconductor packaging continue to enable higher performance in electronic components. With advanced packaging comes tighter tolerances, smaller interconnects, and more vertical layers. Together with increasingly stringent quality and reliability requirements from system manufacturers, these trends have exposed the limitations of existing inspection and metrology techniques.
The X200's technology was developed to quickly and precisely identify small changes in device interconnect structures and to provide real-time feedback for process control and screening.
Instead of pulling a small sample from your manufacturing line for lengthy and data-limited 3D X-ray and cross-sectioning, you can automatically monitor 100% of your production in real-time and achieve new levels of quality, reliability, and production yield.
物联网将复杂的电子系统置于我们每天与之互动的产品中。尽管常规的表面安装区域阵列组件通常100%通过印刷电路板组件(PCBA)XRI检查,但这些工具缺乏分辨率和敏感性,无法检查SIP中较小的功能尺寸的导体。
但是,Bruker的X200 XRI技术允许在微米尺度上进行高速100%检查和计量。X200具有高灵敏度和基于机器学习的检查算法,可以自动检查SIP产品以快速检测过程变化和屏幕缺陷,例如非湿焊点,桥接和空隙。
人工智能,高速网络和其他处理密集型市场的设备已转移到2.5D和3D软件包体系结构,以实现高内存带宽并增加数据传输速率。垂直整合迫使manufacturers to use transmissive inspection techniques to monitor their processes, however, conventional point projection high-resolution X-ray lacks the speed and sensitivity to provide adequate in-line control.
X200’s algorithms acquire massive data sets in seconds with full resolution across the full field of view. Using advanced machine learning algorithms, thousands of solder joints are immediately characterized and evaluated. Detailed heat maps and intelligent outlier detection informs manufacturing process control and screens out defective interconnects.
电力电子设备在电动和自动驾驶汽车中迅速增殖。这些系统对故障和有缺陷的组件尤其不宽容,但是功率组件的结构(散热器,铝线,焊接固定器等)使传统的传播检查技术变得困难或不可能。
X200的专有高功率X射线源技术具有从电源设备收集丰富数据集的敏感性,因此为制造提供了满足最苛刻的汽车质量要求的能力。
X200数据分析工具包通过消除手动处理和解释X射线图像的解释,并让基于图像处理的算法确定单元,从而彻底改变了在半导体包装中使用传播检查技术的使用。
X200的专有分析工具可以实时使用机器学习技术来定位和分析感兴趣的功能,因为该系统从测试的样品中捕获数据。
Supervised model learning can be accomplished on limited sample sizes to progress more quickly to production. With the addition of supervised learning from programmed defects or offline analyses, process control and reject detection criteria can be tuned to the user’s unique application specifications.
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布鲁克partners with our customers to solve real-world application issues. We develop next-generation technologies and help customers select the right system and accessories. This partnership continues through training and extended service, long after the tools are sold.
Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.