尺寸快速扫描
Основные моменты
尺寸快速扫描
The Dimension FastScan®atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.
Особенности
Benchmark for High Speed and High Resolution
Dimension FastScan是第一和仅高速尖端扫描系统，可在不损害分辨率或系统性能的情况下达到每秒扫描速率的框架，而与样本量无关。没有其他高速AFM可以对FastScan进行大量样本访问。加上PeakForce Tapping®，该系统通过线性控制环实现瞬时力量测量，允许点缺陷尺寸和机械分辨率，而不仅仅是在坚硬的平坦晶体上。
Exceptional Productivity
Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.
More Applications and New Insights Faster
Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.
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使用AFM模式扩展您的应用程序
With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.
Bruker建立在核心成像模式的骨架上（接触模式和攻击模式）提供了AFM模式，使用户可以探究其样品的电气，磁性或材料属性。必威手机客户端布鲁克（Bruker）的创新新峰值攻击技术代表了一种新的核心成像范式，该范式已被整合到多种模式中，并并行提供了地形，电气和机械性能数据。
尺寸快速扫描Data Gallery
Аксессуары
Вебинары
最近的AFM网络研讨会
Отзывы
听听我们的客户要说的话
We have been using the Bruker Fastscan AFM for more than two years. In our experience, Fastscan images four to five times faster without degrading resolution compared to other AFMs. In addition, ScanAsyst mode with intelligent auto scan parameter adjustment enables us to quickly scan many samples with ease. The superior Fastscan AFM performance has advanced our group’s reputation with many publications in DNA nanotechnology research.
