完全自动化的大型轮廓精英X 3D光学剖面材料结合了无与伦比的测量功能,并在行业最大的视野和高保真颜色或单色成像中结合了最高的垂直分辨率。没有其他计量系统提供非接触式准确性,吞吐量,操作员便利性和成像功能来解决如此广泛的生产计量应用。Contour Elite X从头开始设计,以满足最苛刻的研发,质量保证和过程质量控制需求,提供了最终的具有GAGE的3D光学分析解决方案。
高保真彩色成像,exclusive side illumination and advanced algorithms, gives Contour Elite X users access to additional perspectives not possible on systems that provide metrology alone, as well as the capability to provide recognizable surface feature details for reporting. This enables users to segment data based on color or grayscale information to rapidly select areas of interest and collect critical metrology data from these specific regions. Combining high-end metrology with the ability to see, recognize, and display what was measured is of great importance, not only for understanding the data, but also for communicating the results.
The Contour Elite X system boasts the best combined lateral and vertical resolution over the industry’s largest field of view, with a sub-nanometer to greater than 10 millimeters vertical range. It includes the R&D 100 Award-winning AcuityXR measurement technology, which provides the ability to break the diffraction limit in your optical measurements. In addition, the system can utilize a megapixel camera that increases X-Y spatial resolution. A large field of view and objective magnifications from 1X to 115X enable characterization of an extremely wide range of surface shapes and textures.
Contour Elite X Profiler是一个非接触系统,具有较大的阶段,使您的样品或零件完好无损并且未受损。我们获得专利的白光干涉测量法(WLI)技术以相对于所使用的放大倍数独立于亚纳米精度获取高度数据。这意味着,即使在毫米平方的图像区域中对超过一百万个数据点进行采样,用户也能够收集高分辨率高度数据 - 几秒钟内。