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Highlights

Fully featured Materials Research software package

X射线反射率（XRR）提供了有关垂直样品密度曲线，层厚度和接口粗糙度的详细信息。高分辨率X射线衍射（HRXRD）测量样品的晶体结构。放牧的含量小角度散射（GISAXS）用于评估纳米粒子和孔隙率。残余应力分析探测大量样品和多晶涂层的应变状态。

除了常规的单曲线扫描外，Leptos还可以分析高分辨率HRXRD和XRR相互空间图，GISAXS和XRD²应力框架，HRXRD，XRR和残留应力应用的面积映射。使用0-D，1-D还是2-D检测器收集数据都没关系。
The GUI can be customized to accommodate the requirements of both scientific researchers and industrial operators.

多个XRR，HRXRD，GISAXS和RS测量的联合评估
高级X射线散射理论和数值方法，用于直接和相互空间中数据的估计和拟合
Naturally integrated processing of the 1- and 2-dimensional data sets measured by point, line and two-dimensional detectors
通用样品模型编辑器，用于参数化任何类型的薄膜和大量样品
Comprehensive and extendable material database covering all 230 crystallographic space groups
Area mapping tool for display and evaluation of the measurements performed over large sample areas
Advanced sin²ψ method for Residual Stress analysis of 1-D and 2-D data, as well as the multiple (hkl) method of evaluating the stress gradient in polycrystalline coatings

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特征

diffrac.leptosModules

leptos r

With LEPTOS R diffuse scattering rods and rocking curves can be fitted both as a separate curve and as a consistent set of several curves in any combination of transverse and longitudinal scans.

leptos ris designed for the analysis of X-ray Reflectivity (XRR) data and off-specular Diffuse Scattering (DS) from thin layered structures. The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the R module inherits all the functionality common for the whole package.

leptos rhas been highly rated in several international benchmarks, including the VAMAS project A10. The structure of LEPTOS R is compliant with the newly developed international rfCIF standard for the data format of XRR data.

leptos h

Leptos H包含一个区域映射模块，该模块可以治疗在大型样本区域上逐点处理的HR-XRD数据并显示样品参数的映射。

leptos hstands for High-Resolution X-ray Diffraction and Grazing-Incidence X-ray Diffraction data analysis.

The module is fully integrated in the LEPTOS suite, which incorporates the simultaneous analysis of HRXRD, GISAXS and XRR data. As a part of the LEPTOS suite, the H module inherits all the functionality common for the whole package.

Leptos s

Residual stress gradients can be calculated from multiple {hkl} measured at different grazing-incident angles. The absorption and refraction of X-rays, as well as the coating thickness, are taken into account for the calculation.

Leptos sis an innovative, powerful and comprehensive module for the analysis of Residual Stresses measured by 0D, 1D or 2D detectors by use of classic sin2ψ and extended XRD2 methods. The module is fully integrated in the LEPTOS suite and inherits all the functionality common for the whole package.

leptos g

Leptos G允许将2D数据集成到适合的1D数据集中，并在实验室和相互空间坐标之间进行2D数据的转换。

leptos gmakes an evaluation of Grazing-Incidence Small-Angle Scattering data, measured from the samples containing nanoscale particles embedded within the undersurface region or located on the surface of sample. These can be, for example, buried or surface semiconductor quantum dots and islands, porous materials, condensed powder, embedded in polymers nanoparticles, etc. The license for module G includes also R module for X-ray Reflectivity.

Specifications

diffrac.leptosSpecifications

Version

当前的软件版本为v7.10.12

Analytical methods

Dynamical Parratt’s formalism

Diversity of interfacial roughness models

Operator Method for the calculation of X-ray scattering parameters

Patented Method of EigenWaves (MEW)

快速2x2和精确的4x4递归矩阵形式主义

经典和扩展SIN2ψ以及XRD2方法

Evaluation of residual stresses from multiple {hkl}

Stress/strain gradients in thin polycrystalline coatings

操作系统

Windows 8 and 10 (32-bit or 64-bit)

More Information

diffrac.leptosResources

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