ContourX-100
Highlights
ContourX-100
The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities in a streamlined package that incorporates decades of proprietary Bruker white light interferometry (WLI) innovation. Next-generation enhancements include a new 5 MP camera and updated stage for larger stitching capabilities, and a new measurement mode, USI, for even greater convenience and flexibility for precision machined surfaces, thick films, and tribology applications. You will not find a benchtop system with better value than the ContourX-100.
Features
Unparalleled Metrology
The ContourX-100 profiler is the culmination of over four decades of proprietary optical innovation and industry leadership in non-contact surface metrology, characterization, and imaging. The system utilizes 3D WLI and 2D imaging technology for multiple analyses in a single acquisition. ContourX-100 is robust in all surface situations from 0.05% to 100% reflectivity.
Unmatched Value and Analysis
借助数千种自定义分析以及Bruker的简单而功能强大的VisionXpress™和Vision64®用户界面，Contourx-100台式台上均在实验室和工厂地板上都优化了生产力。硬件和软件结合在一起，以简化地访问顶级高通量光学性能，完全超过可比较的计量技术。
