Stylus Profilometer

DektakXT

The gold standard in stylus profiling
DektakXT

Highlights

DektakXT

Dektakxt®手写笔配置计是一种革命性的台式设计,可实现无与伦比的重复性4Å,扫描速度提高了40%。这是手写笔伪造者表现的主要里程碑是达克塔克®创新和行业领导力超过五十年的高潮。Dektakxt通过其行业第一组的结合,提供了最终的性能,易用性和价值,以实现从研发到QC的更好的过程监控。DEKTAKXT中纳入的技术突破可为微电子,半导体,太阳能,高亮度LED,医学和材料科学行业提供关键的纳米水平层面测量。必威手机客户端

4 angstrom
repeatability
Delivers industry-leading accuracy.
Single-arch
design
Provides breakthrough scan stability.
自我对准
styli
Enables effortless tip exchange.

Features

Features

Accelerating Data Collection and Analysis

Utilizing a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading performance. Vision64, Bruker’s 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.

DektakXT's 64-bit, parallel-processing Vision54 completes and processes large 3D data files in nearly half the time.

Delivering the Most Repeatable Measurements

Dektak's all-in-one stylus sensor enables simultaneous large vertical range and low-force scanning.

实现单核管结构使Dektakxt Sturdier更具限制环境噪声的影响。Dektakxt的升级“智能电子”降低了温度变化并采用现代处理器,以最大程度地诱发错误的噪声,从而使其成为一个更强大的系统,能够测量<10nm的步骤高度。

Perfecting Operation and Analysis

Bruker的Vision64软件通过提供最直观,最简化的视觉用户界面来补充Dektakxt的创新设计。智能体系结构和可自定义的自动化功能的组合允许快速,全面的数据收集和分析。无论您是使用配方对单扫描进行例行分析,还是应用自定义过滤器设置和计算,Dektakxt的数据分析仪都会显示当前数据,同时还揭示了其他可能的分析。

DektakXT's Vision64 significantly simplifies and accelerates operation and data analysis.

Making Things Easy

DektakXT features the fastest and easiest tip exchange, enabling various tips to address the widest range of applications.

The DektakXT’s self-aligning stylus assembly allows the user to quickly and easily change stylus size while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.

Ensuring High Yield

DektakXT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface with unmatched repeatability. This efficient monitoring can save valuable time and money by improving yields.

DektakXT 3D map of a hybrid circuit.

网络研讨会

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Hear What Our Customers Have to Say

I am a longtime owner of Bruker profilers. My first one was a Dektak 6 stylus profilometer some twenty years ago, then a Dektak 150, followed by a ContourGT optical profiler, and most recently a Dektak XT. What’s more, all these machines are still working! They are just ‘work horses’, delivering fine and accurate measurements day-in and day-out, with minimal down-time. As the manager of a multi-user facility, I am really happy for all these years of good partnership with Bruker. Hundreds of students have already used those machines, thousands of times. Which fully proves these profilers are robust, reliable and friendly platforms.

耶路撒冷希伯来大学纳米制造负责人单位Shimon Eliav博士

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