Grade Control

Energy dispersive X-Ray Fluorescence (XRF) is the most trusted method for grade control in mines and mineral processing facilities. Bruker’s XRF analyzers allow for the simultaneous analysis of elemental concentrations required for identification of grades, sub-grades, and waste. Bruker’s solutions are focused on maximizing value and reducing risk along the entire mining value chain from mine-site portable XRF analysis to high throughput grade control and impurities workflows. Solutions include:

• 高容量台面S2 PUMA2系列能够在C到AM的分析到一个，12和20个样本变频器的选项。

• TheCTX, a new portable single-sample ruggedized countertop XRF with battery backup for analyzing from Mg to U

• TheS1泰坦handheld XRF with optional safety-interlocked benchtop stand for the most flexibility in analyzing from Mg to U

Wavelength dispersive XRF (WDXRF) provides the most accuracy and lowest limits of detection, particularly in complex ores. WDXRF uses X-ray optics to disperse the fluorescence into individual wavelengths for each element. The resulting spectrum has a low background and eliminates most element overlaps. This technology is critical for grade control applications where discrimination of trace elements or elements with many overlaps is important. Bruker’s solutions for WDXRF

• TheS8 LIONprovides the fastest time-to-result as a multi-channel WDXRF. Analyze up to 16 elements simultaneously for high throughput grade control and impurity applications where precision at low detection limits is required.

• TheS8虎Series 2 is a robust and easy-to-use sequential WDXRF capable of providing major and trace elements in a single run. The S8 TIGER provides the analytical flexibility required for demanding and diverse supervision of mining or stockpile management.

• TheS6 Jaguar.是一个紧凑的WDXRF，足以部署到矿场现场实验室，但足够强大，以满足最苛刻的等级歧视的需求。

复杂的矿石通常需要矿物识别作为等级控制工作流程的一部分。例如，高岭石可以替代铁矿石中的可粘合体，不能在视觉上识别。当将等级块分配给高等级，低等级或废岩时，也可能是可以量化矿物组合。结合聚类分析的快速X射线衍射（XRD）是矿物级控制和杂质分析的新兴工具。当矿物协会是级别控制和散装元素或矿物质含量的关键鉴别符，并不讲述全文 - 自动化矿物学步骤，为矿物加工提供额外的信息密钥。Bruker在级别控制中的Minerology解决方案包括：

• AMICS是力量的自动扫描矿物学的解决方案ning electron microscopes. AMICS automates the collection of backscatter electron and EDS X-ray points to make mineral maps to calculate locking, liberation, and modal minerology.

• TheD2相投以紧凑型桌面包装中的级别控制分析所需的速度提供XRD分析。

• TheDIFFRAC.SUITE™software provides all the tools needed for grade control and quantitative analysis for grade sorting. The PolySNAP module provides the cluster-analysis while the TOPAS software allows profile fitting and quantitative Rietveld analysis.