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原子力显微镜

Dimension FastScan

首先是无屈服的高速AFM

强调

Dimension FastScan

尺寸快速扫描®原子力显微镜（AFM）系统是专门设计用于快速扫描的，而不会丢失分辨率，损失力控制，增加的复杂性或额外的运营成本。使用FastScan，您可以立即实现AFM图像，其预期高性能AFM的高分辨率。无论您是在调查样品以找到感兴趣的区域时扫描> 125Hz，还是在空气或液体中每图像框架1秒的时间速率重新定义AFM体验。

No-compromise
高速性能
Delivers highest resolution any time, every time, independent of sample size.
即时的
nanoscale dynamics
Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid.
自动化
setup, data acquisition, and analysis
使系统操作令人惊讶地简单，同时提高了prductivity，使您可以专注于研究。
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特征

特征

高速和高分辨率的基准

Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with峰值敲击®，该系统通过线性控制环实现瞬时力测量，允许点缺陷维度和机械分辨率，而不仅仅是在坚硬的平坦晶体上。

方解石的点缺陷分辨率刚度图像。15 nm图像尺寸（面板1）。IPMMA膜的分子分辨率粘附图像。100 nm图像尺寸（面板2）。样本由Martin-Luther-UniversitätHalle-Wittenberg教授Thurn-Albrecht教授提供。

Exceptional Productivity

在10分钟内完全无人看管，自动化，完全自我优化的六个不同样本的成像，在每种情况下都产生出版物质量的结果。

Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

更快的应用程序和新见解更快

Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.

Investigate forces driving wetting and de-wetting on polystyrene films (<100nm thick) on hydrophobically treated silicon surfaces.
无定形药物制剂研究，在60分钟内捕获60个地点。样品由M. E. Lauer，O。Grassmann，F。Hoffmann-Laroche，瑞士巴塞尔。

申请

AFM Modes

通过AFM模式扩展您的应用程序

Bruker拥有无与伦比的成像模式的套件，可以为每项调查提供AFM技术。

Bruker建立在核心成像模式的骨架上 - 接触模式和敲击模式 - 提供AFM模式，使用户可以探究其样品的电气，磁性或材料属性。必威手机客户端布鲁克（Bruker）的创新新峰值攻击技术代表了一种新的核心成像范式，该范式已被整合到多种模式中，并并行提供了地形，电气和机械性能数据。

了解有关AFM模式的更多信息

Dimension FastScan Data Gallery

3D surface representing sample topography with false coloring by loss modulus. Blue areas have higher loss modulus and the red areas are lower loss modulus corresponding to the PS matrix and PMMA inclusions respectively. Loss modulus map generated by contact resonance via Bruker’s FASTForce Volume Nanomechanics mode. 5µm scan, ~ 590kHz, 256x256 pixels.
To maximize lateral resolution, stay close but not too close. PeakForce Tapping uniquely allows you to do this. See Physical Review B 56(7), 4159, 1992, and Chemical Review 88, 927 (1988) for the detailed modeling of the tip-sample interaction.
石墨烯在六角硼硼化物上的峰值QNM模量图像，揭示了与高度局部应变缓解对齐后向相应晶格的过渡。另请参见Nature Physics 10，451–456（2014）。
整个晶圆上的埃静态粗糙度测量。96次测量在2小时内。
增加scan speed on even the high-resolution Icon head with Fast Tapping.
被PMMA（蓝绿色）基质包围的联合性聚丙烯结构域（紫）。用模量绘制的地形数据可以轻松识别组件，揭示了由syndiotiotic聚丙烯形成的薄片，通过PMMA基质传播。图像尺寸8 µm。
当前在垂直站立的碳纳米管上进行成像。只有使用Peakforce Tuna才能。
左：具有峰值捕获的原子尺度力立方体显示了单个原子在垂直（XZ）切割中的位置。右：平均峰值捕获数据显示溶剂结构的证据。
峰值敲击高度图像（左）和力曲线（右）显示了表面原子布置和定解型和云母之间的原子尺度样本相互作用的差异。
C36H74 Alkane在Hopg上。
FastScan使用图标扫描仪支持Bruker的申请专利的Peakforce QNM成像模式，并使用FastScanner支持纳米机械映射。借助这项技术，研究人员现在可以在纳米力学特性之间以高扫描速率进行绘制和绘制量化和相对区分，同时以高分辨率对样品地形进行成像。
1秒钟，尺寸FastScan AFM。流体中的云母上的DNA（通过APS方法进行准备）。样本由大学Y. Lyubchenko提供。内布拉斯加医学。CTR。
Carry out electrical characterization at the nanoscale with Bruker-proprietary AFM modes for greater sensitivity, resolution, and dynamic range. PeakForce TUNA and PeakForce SSRM provide unique electrical characterization capability while simultaneously providing correlated mechanical property information on the same sample location.
Perform manipulation and lithography at the nanometer and molecular scales. The XYZ closed-loop Icon scanner provides precise probe positioning with no piezo creep and extremely low-noise for the best positioning of any available nanomanipulation system.
Heating and Cooling Execute temperature control and thermal analysis on samples from -35°C to 250°C while scanning in various AFM modes. Alternately, perform sub-100nm-node heating with the scanning probe up to 500°C.
Heating and Cooling Execute temperature control and thermal analysis on samples from -35°C to 250°C while scanning in various AFM modes. Alternately, perform sub-100nm-node heating with the scanning probe up to 500°C.
Range of AFM imaging modes and techniques performed on a graphene flake, including adhesion, modulus, deformation, and topography.

配件

配件

力量AFMProbes

力量AFMProbes

在我们的在线商店中找到各种各样的AFM探针，悬臂和配件。我们的AFM专业知识都内置在每个调查中！
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维度系统的自动软件

自动软件

增强维度系统的纳米级自动化
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网络研讨会

网络研讨会

Recent AFM Webinars

推荐

推荐

听到我们的客户要说的话

我们已经使用Bruker FastScan AFM已有两年多了。根据我们的经验，FastScan图像与其他AFM相比，没有降解分辨率的速度快四到五倍。此外，具有智能自动扫描参数调整的扫描模式使我们能够轻松扫描许多样品。高级FastScan AFM的表现在DNA纳米技术研究中的许多出版物中提高了我们小组的声誉。

Shou-jun Xiao博士, Nanjing University, Nanjing China

More Information

More Information

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