QC-RT
X-ray diffraction imaging (XRDI) inspection system
Основные моменты
QC-RT
The Bruker QC-RT is a defect metrology system using the latest X-ray diffraction imaging (XRDI) technology in reflection mode to identify defects in high value substrates, such as CdTe and other dense materials.由于X射线衍射的性质，并且与光学技术不同，晶圆不需要蚀刻或抛光即可看到缺陷。
Особенности
基于CDTE的底物的倾斜和缺陷
CDTE和CDHGTE广泛用于IR检测，尤其是用于夜视和薄膜太阳能电池。对于这些应用，生长晶体的质量变得很重要。QC-RT用于此类晶体的质量控制，并用于进一步开发这些底物的处理。
подер代
Support
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布鲁克partners with our customers to solve real-world application issues. We develop next-generation technologies and help customers select the right system and accessories. This partnership continues through training and extended service, long after the tools are sold.
Our highly trained team of support engineers, application scientists and subject-matter experts are wholly dedicated to maximizing your productivity with system service and upgrades, as well as application support and training.