Hysitron TS 75 Tribsoscope
Highlights
Hysitron TS 75 Tribsoscope
布鲁克’s Hysitron TS 75 TriboScope delivers quantitative, rigid-probe nanoindentation and nanotribological characterization capabilities to the world of atomic force microscopy. The Hysitron TriboScope interfaces with Bruker’s Dimension Icon, Dimension Edge, and MultiMode 8 AFMs to expand the characterization capabilities of these microscopes. By utilizing a rigid test probe, the TriboScope removes the intrinsic limitations, variability, and complexity associated with cantilever-based measurements to deliver quantitative and repeatable mechanical and tribological characterization over nanometer-to-micrometer length scales.
eigenschaften
The Rigid-Probe Advantage
大多数AFMS利用合规的悬臂进行机械或摩擦学测试，在将悬臂的弯曲和旋转刚度与材料对施加应力的响应中分离出来时提出了重大挑战。Tribsoscope利用刚性测试探针组件，可以在测试过程中进行直接控制和测量所施加的力和位移。
专有静电力致动
Tribsoscope利用专有的静电力致动和电容式置换传感传感器技术来传递行业领先的噪声地板，而较低的热漂移将特性表征到纳米级的底部。
力和位移反馈控制
底环镜在闭环力控制或位移控制下运行。利用78 kHz的反馈回路速率，锥体可以响应快速材料变形瞬态事件，并忠实地重现操作员定义的测试功能。必威官网体育下载
