Hysitron TS 75 TriboScope
Punti salienti
Hysitron TS 75 TriboScope
Bruker的Hysitron TS 75 Tribsoscope向原子力显微镜世界提供了定量，刚性探针纳米凹痕和纳米磨练的能力。Hysitron Tribsoscope与Bruker的尺寸图标，尺寸边缘和多模8 AFMS接口，以扩展这些显微镜的特征能力。通过利用刚性测试探测器，锥体消除了与基于悬臂的测量相关的固有局限性，可变性和复杂性，以在纳米到微计的长度尺度上提供定量和可重复的机械和摩擦学表征。
卡特里斯蒂奇
刚性探针优势
Most AFMs utilize a compliant cantilever to conduct mechanical or tribological testing, posing significant challenges in separating a cantilever’s flexural and rotational stiffness from the material’s response to applied stress. The TriboScope utilizes a rigid test probe assembly, allowing direct control and measurement of applied force and displacement during the test.
Proprietary Electrostatic Force Actuation
The TriboScope utilizes proprietary electrostatic force actuation and capacitive displacement sensing transducer technology to deliver industry-leading noise floors and low thermal drift for characterizing properties to the bottom of the nanoscale.
Force and Displacement Feedback Control
The TriboScope operates under closed-loop force control or displacement control. Utilizing a 78 kHz feedback loop rate, the TriboScope can respond to fast material deformation transient events and faithfully reproduce the test function defined by the operator.
