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E-Book: The Latest Advancements in AFM Nanoelectrical Modes

了解基于AFM的电气表征的基本要素和优势，以及Bruker的DataCube模式如何扩展纳米电特性测量的潜在应用的数量和类型。

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The history, advantages, and constraints of atomic force microscopy (AFM), especially for electrical characterization.
基于AFM的纳米级电性能表征对深远的学术，科学和行业影响。
3D纳米电属性映射如何使 DataCube modes — removes the operational, technical, and analytical limitations that have historically restricted innovation.
Case studies of practical applicationsof AFM nanoelectrical modes.

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