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电子书：AFM纳米电子模式的最新进展

Learn about the fundamental elements and advantages of AFM-based electrical characterization and how Bruker's DataCube modes expand the number and type of potential applications of nanoelectrical property measurement.

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The history, advantages, and constraints of atomic force microscopy (AFM), especially for electrical characterization.
The far-reaching academic, scientific, and industry impacts of AFM-based nanoscale electrical property characterization.
How 3D nanoelectrical property mapping — made possible with DataCube modes — removes the operational, technical, and analytical limitations that have historically restricted innovation.
Case studies of practical applicationsof AFM nanoelectrical modes.

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