D8 Advance Plus

D8 Advance Plus是D8 Advance变体，代表了多功能，多用户实验室的最终X射线平台。该系统完美地符合所有样本类型的需求，包括粉末，散装材料，纤维，床单和薄膜（无定形，多晶和外延）：必威手机客户端

• 传统的X射线粉末衍射（XRD）
• Pair Distribution Function (PDF)analysis
• Small and Wide Angle X-ray Scattering (SAXS, WAXS)
• xrr(reflectometry) and HRXRD (rocking curves, reciprocal space mapping)
  在环境和非事实条件下。

该系统的真正美在于它可以在多达6个不同的光束几何形状之间切换的能力，从将粉末的bragg-brentano几何形状集中到高分辨率平行束Kα1几何形状，以进行外观下行薄膜以及两者之间的所有内容。按下按钮完全控制了完全软件。

无论样本类型和应用程序是什么，无论您是新手还是专家用户：D8 Advance Plus都会凭借其无与伦比的灵活性和轻松使用的数据质量设定了新的基准。

The patented TRIO optics simplify the usage of the D8 ADVANCE, allowing the largest variety of applications and sample types. With user convenience in mind, the system features automatic, motorized switching between up to 6 different beam geometries. Without manual user intervention, the system is capable of switching between three beampaths:

• Focusing Bragg-Brentano for powders
• 毛细管，GID和XRR的高强度平行梁Kα1,2
• 外延薄膜的高分辨率平行梁Kα1几何形状

它非常适合所有样本类型，包括在环境或非镜子条件下的粉末，散装，纤维，薄板和薄膜（无定形，多晶和外延）。

Multimode functionality (0D-1D-2D, snapshot and scanning modes) allows the EIGER2 R detectors to cover a wide range of measurement methods ranging from powder to materials research applications. Not the typical jack of all trades, the EIGER2 is a master of all applications. With a dynamic range that allows absorber free measurements, large 1D size for ultra fast powder measurements and rapid reciprocal space maps and over 500k pixels for large two dimensional coverage, the EIGER2 sets a new standard for multimode detectors. The EIGER2 combines beamline detector technology from DECTRIS Ltd. with software and hardware integration from BRUKER into a seamless easy to use solution.

X射线粉末衍射（XRPD）技术是材料表征的最重要工具之一。必威手机客户端嵌入到粉末图案中的许多信息直接来自存在的相位的原子布置。D8 Advance和Fiffrac.Suite软件允许支持简单执行常见的XRPD方法：

• 鉴定晶体和无定形相，并确定标本纯度
• 多相混合物中晶体和非晶相的定量分析
• 微观结构分析（结晶石大小，微疗法，混乱…）
• Bulk residual stress resulting from thermal treatment or machining in manufactured components
• 纹理（首选方向）分析
• 索引，Ab-Initio晶体结构的确定和晶体结构细化

Analysis of thin films and coatings is based on the same principles of XRPD, but with further beam conditioning and angular control. Typical examples include, but are not limited to, phase identification, crystalline quality, residual stress, texture analysis, thickness determination and composition vs strain analysis. Analysis of thin films and coatings is focusing on properties of layered materials with nm to µm thickness, ranging from amorphous and poly-crystalline coatings to epitaxially grown films. The D8 ADVANCE and the DIFFRAC.SUITE software enable high quality analyses of thin films including:

• Grazing Incidence Diffraction
• X射线反射仪
• High Resolution X-ray Diffraction
• 相互空间映射