NanoWizard 4 XP NanoScience

NanoWizard 4 XP纳米科学配备了一系列新功能，包括：

• PeakForce Tapping®for easy imaging
• Fast Scanning optionwith up to 150 lines/sec
• NestedScanner Technologyfor high-speed imaging of surface structures up to 16.5µm with outstanding resolution and stability
• 新的瓷砖功能for automated mapping of large sample areas
• V7软件with revolutionary new workflow-based user interface
• DirectOverlay™ 2 softwarefor perfect integration and data correlation with advanced fluorescence microscopy platforms
• Vortis™ 2 controller用于高速信号处理和最低的噪声水平

PeakForce Tapping provides superior force control and an uncomplicated setup, no matter what the sample or environment. No expert knowledge or cantilever tuning is necessary.

It enables precise control of probe-to-sample interactions and minimizes imaging forces, thereby protecting your tip and ensuring consistent, long-term, high-resolution imaging.

The fastest and easiest way to navigate is to see where you want to go.DirectOverlay 2提供即时导航，直接选择扫描仪范围内任何地方的测量位置。AFM压电范围的侧面约束的电动精度阶段和HybridStage™免费实验，并允许直接机动运动到选定的位置。

The new直接使用feature automatically creates a large optical overview to accelerate this process. Multiscan enables tiling of high-resolution images to build up a comprehensive overview of the sample. Repetitive or complicated measurement sequences can be automated usingExperimentPlanner™macros.

The images show PDMS stamped surface pattern, sample courtesy of Dr. Claudio Canale, University of Genoa, Italy. [1] Optical image of reference pattern. Four square regions are marked with a concentric corner pattern, the inner corners form a 50 micron square with test patterns printed in the center, but not visible in the optics. Imported into the SPM software with DirectOverlay, such images allow single-click navigation between reference positions separated by many times the piezo range. QI Advanced images of two such reference patterns (see arrows), topography [2] + [4] and adhesion images [3]+ [5].

The characterization of electrical, electromechanical or magnetic sample properties was always a difficult task, in particular on loosely attached, brittle or soft samples. JPK'sQI™-Advancedmode capabilities make this easy and straight forward. The NanoWizard 4 XP NanoScience system is supported by a comprehensive range of modes and accessories, each designed for easy handling and to meet the individual needs of researchers. Many experiments investigating material properties, including electrical properties, benefit from working in an enclosed cell to measure under a controlled inert gas atmosphere.

材料特性的表征

• Mechanical properties (elasticity, stiffness, adhesion, deformation)
• Electrical properties with Electrical Force Microscopy, Conductive-AFM, Kelvin Probe AFM (KPM), Scanning Tunneling Microscopy (STM)
• Magnetic properties with MFM
• Electro-optical properties with photo-conductive AFM
• Local thermal properties by scanning thermal AFM
  

现场AFM在施加外部负载以更改样本属性时

• Piezoresponse Microscopy with high Voltages (PFM)
• Observe samples under external load with the StretchingStage
• Apply external magnetic fields
• Electrochemistry and scanning electrochemistry (SECM)
  

样本环境控制选项

• Sample heating from ambient to 300°C
• Sample cooling from ambient to – 35°C
• Cryo-AFM down to – 150°C with the CryoStage
• Defined sample humidity
• Perfect for experiments in fluids even harsh fluids
• Experiments with controlled gas flow
• 杂物箱中苛刻的环境中的实验
  

• Fast Scanning optionwith up to 150 lines/sec for tracking dynamic processes
• 现在以布鲁克的独家峰值攻击为标准
• Large scan field of 100 × 100 × 15 µm³and atomic lattice resolution on inverted microscopes
• New workflow-based user interfacefor ergonomics and ease of operation
• 新的瓷砖功能for automated mapping of large sample areas together with the HybridStage
• New Vortis 2 controllerwith high-speed low-noise DACs and cutting-edge position sensor readout technology
• Highest flexibility and upgradeabilitywith a broad range of modes and accessories
  

Standard Operating Modes

Imaging modes

• Now with PeakForce Tapping
• 接触模式与横向力显微镜（LFM）
• Tapping Mode™ with PhaseImaging™

Force measurements

• Static and dynamic spectroscopy
• Advanced force mapping

• Higher harmonics imaging
• Kelvin Probe Microscopy and SCM MFM and EFM (see also QI mode)
• Conductive AFM (see also QI mode)
• STM
• Electrical spectroscopy modes
• Piezoresponse Microscopy for high voltages
• Electrochemistry with temperature control and optical microscopy
• NanoLithography
• NanoManipulation
• Nanoindentation
• Scanning Thermal AFM
• FluidFM® solution from Cytosurge
• ExperimentPlanner for designing a specific measurement workflow
• RampDesigner™ for custom designed clamp and ramp experiments
• ExperimentControl feature for remote experiment control
• DirectOverlay 2 for combined AFM and optical microscopy
• Cellhesion®，Tao™和HybridStage™模块可提供其他XY或Z样品运动阶段
  

光学系统/附件，电化学解决方案，电气样品表征，环境控制选项，软件模块，温度控制，声学和振动隔离溶液等等。Bruker为您提供了正确的配件，以控制样本条件并执行成功的实验。

The new V7 software interface guides users through the workflow to set up experiments intuitively and makes it simple, even for users with minimal AFM experience, to progress confidently to generating high-quality data. Each stage of the setup and operation works as an optimized desktop that brings all the vital information into focus with a single click.

• On-screen, context-sensitive help
  
• Status feedback for alignment and setup
• Efficient task-based experiment selection
• Fast access to favorite and recently used experiments
• One-click probe calibration
• Instant overview of the key data
• User management for Multi-User environments like imaging facilities