NanoWizard 4 XP NanoScience
Основные моменты
NanoWizard® 4 XP NanoScience
The NanoWizard® 4 XP NanoScience atomic force microscope delivers atomic resolution and a large scan range of 100 µm in one system. It enables fast scanning with rates of up to 150 lines/sec and seamless integration with advanced optical techniques. A wide range of modes and accessories for environmental control, mapping of nanomechanical, electrical, magnetic or thermal properties, makes it the most flexible system available on the market today.
Особенности
Highest flexibility combined with extreme performance
The NanoWizard 4 XP NanoScience is equipped with a range of new features, including:
- PeakForce Tapping®for easy imaging
- Fast Scanning optionwith up to 150 lines/sec
- NestedScanner Technologyfor high-speed imaging of surface structures up to 16.5µm with outstanding resolution and stability
- New tiling functionalityfor automated mapping of large sample areas
- V7 Softwarewith revolutionary new workflow-based user interface
- Directoverlay™2软件for perfect integration and data correlation with advanced fluorescence microscopy platforms
- Vortis™ 2 controllerfor high-speed signal processing and lowest noise levels
PeakForce Tapping provides superior force control and an uncomplicated setup, no matter what the sample or environment. No expert knowledge or cantilever tuning is necessary.
It enables precise control of probe-to-sample interactions and minimizes imaging forces, thereby protecting your tip and ensuring consistent, long-term, high-resolution imaging.
Automated analysis of large sample areas with new tiling functionality
The fastest and easiest way to navigate is to see where you want to go.DirectOverlay 2provides instant navigation, with direct selection of measurement positions anywhere within the scanner range. The Motorized Precision Stage and HybridStage™ free experiments of the lateral constraints of the AFM piezo range, and allow direct motorized movement to selected positions.
The newDirectTilingfeature automatically creates a large optical overview to accelerate this process. Multiscan enables tiling of high-resolution images to build up a comprehensive overview of the sample. Repetitive or complicated measurement sequences can be automated usingExperimentPlanner™macros.
这些图像显示了PDMS盖章的表面图案，样本由意大利热那亚大学Claudio Canale博士提供。[1]参考模式的光学图像。四个正方形区域有一个同心角模式，内角形成一个50微米正方形，中央印有测试图案，但在光学元件中不可见。此类图像被导入带有Directoverlay的SPM软件，允许单击在电池范围内的参考位置之间的单击导航。Qi的两个这样的参考模式的高级图像（请参阅箭头），地形[2] + [4]和粘附图像[3] + [5]。
Enhanced mapping of material properties
电力机电或磁性样品特性的表征始终是一项艰巨的任务，尤其是在松散附着，脆性或软样品上。JPK的Qi™ - 促进mode capabilities make this easy and straight forward. The NanoWizard 4 XP NanoScience system is supported by a comprehensive range of modes and accessories, each designed for easy handling and to meet the individual needs of researchers. Many experiments investigating material properties, including electrical properties, benefit from working in an enclosed cell to measure under a controlled inert gas atmosphere.
Characterization of material properties
- Mechanical properties (elasticity, stiffness, adhesion, deformation)
- Electrical properties with Electrical Force Microscopy, Conductive-AFM, Kelvin Probe AFM (KPM), Scanning Tunneling Microscopy (STM)
- MFM的磁性
- Electro-optical properties with photo-conductive AFM
- 通过扫描热afm扫描局部热性能
In-Situ AFM while applying external loads to change sample properties
- 高电压（PFM）的压电显微镜
- Observe samples under external load with the StretchingStage
- Apply external magnetic fields
- Electrochemistry and scanning electrochemistry (SECM)
Sample environmental control options
- Sample heating from ambient to 300°C
- Sample cooling from ambient to – 35°C
- Cryo-AFM down to – 150°C with the CryoStage
- 定义的样品湿度
- Perfect for experiments in fluids even harsh fluids
- Experiments with controlled gas flow
- Experiments in demanding environments in a glove box
Key Features
- Fast Scanning optionwith up to 150 lines/sec for tracking dynamic processes
- Now with Bruker’s exclusive PeakForce Tapping as standard
- L100×100 µm的ARGE扫描场3and atomic lattice resolution on inverted microscopes
- New workflow-based user interfacefor ergonomics and ease of operation
- New tiling functionalityfor automated mapping of large sample areas together with the HybridStage
- New Vortis 2 controllerwith high-speed low-noise DACs and cutting-edge position sensor readout technology
- Highest flexibility and upgradeability具有广泛的模式和配件
Применения
NanoWizard 4 XP NanoScience Data Gallery
Bruker’s BioAFMs allow life science and biophysics researchers to further their investigations in the fields of cell mechanics and adhesion, mechanobiology, cell-cell and cell-surface interactions, cell dynamics, and cell morphology. We have collected a gallery of images demonstrating a few of these applications.
Спецификации
Operating Modes
Standard Operating Modes
成像模式
- Now with PeakForce Tapping
- Contact mode with lateral force microscopy (LFM)
- Tapping Mode™ with PhaseImaging™
Force measurements
- 静态和动态光谱
- Advanced force mapping
Optional Modes
- Fast Scanning option with up to 150 lines/sec
- 快速Qi高级模式用于定量数据，非常适合软样品
- Mechanical properties such as adhesion, elasticity, stiffness, deformation
- Conductivity and charge distribution mapping
- Contact Point Imaging (CPI) with zero force
- Molecular recognition imaging for binding site mapping
- Advanced AC modes such as FM and PM with Q-control & Active
Gain Control
- Higher harmonics imaging
- Kelvin Probe Microscopy and SCM MFM and EFM (see also QI mode)
- Conductive AFM (see also QI mode)
- STM
- Electrical spectroscopy modes
- Piezoresponse Microscopy for high voltages
- Electrochemistry with temperature control and optical microscopy
- NanoLithography
- 纳米流动
- Nanoindentation
- Scanning Thermal AFM
- fluidfm®溶液来自细胞神经的溶液
- 用于设计特定测量工作流程的实验计划
- RampDesigner™ for custom designed clamp and ramp experiments
- ExperimentControl feature for remote experiment control
- DirectOverlay 2 for combined AFM and optical microscopy
- Additional XY or Z sample movement stages available with CellHesion®, TAO™ and HybridStage™ module
Аксессуары
The Widest Range of Accessories in the Market
Optical systems/accessories, electrochemistry solutions, electrical sample characterization, environmental control options, software modules, temperature control, acoustic and vibration isolation solutions and more. Bruker provides you with the right accessories to control your sample conditions and to perform successful experiments.
Программное обеспечение
New workflow-based user interface redefines user-friendliness
新的V7软件接口可指导用户通过工作流程进行直观设置实验，并使其变得简单，即使对于具有最少AFM经验的用户，也可以自信地进步以生成高质量的数据。设置和操作的每个阶段都可以作为优化的桌面，可以单击一次将所有重要信息焦点带入焦点。
- 屏幕上的上下文敏感帮助
- Status feedback for alignment and setup
- Efficient task-based experiment selection
- Fast access to favorite and recently used experiments
- One-click probe calibration
- Instant overview of the key data
- User management for Multi-User environments like imaging facilities
可商
Watch Recent BioAFM Webinars
Our webinars cover best practices, introduce new products, provide quick solutions to tricky questions, and offer ideas for new applications, modes, or techniques.