XRF地球化学
Mining Process Optimization
XRF的采矿过程优化
The quality of an ore extracted from the ground is never constant. This makes frequent monitoring of raw and sometimes partially processed material a critical part of all mining projects.
X射线荧光（XRF）是用于矿物质生产和加工等级控制的最接受的分析技术。布鲁克（Bruker）广泛的XRF仪器可以满足生产监测的任何需求，以分离废物形式的矿石。XRF通过测量元素被主X射线源激发时产生的次级X射线荧光来起作用。XRF分析仪可以测量岩石中的元素浓度。元素浓度可用于识别级，级和废物，并防止废岩稀释矿石。XRF的优点包括：
XRF很快，分析了单个频谱的所有元素
分析从碳到美国的各种元素
测量从痕迹（PPM）到100％的元素浓度
Simple and fast sample preparation
轻松的过程自动化和机器人样品更改的结合
The possibility of non-destructive elemental analysis of core
Wavelength Dispersive XRF
Wavelength Dispersive X-ray Fluorescence Spectrometers
Wavelength dispersive X-ray fluorescence spectrometers (WDXRF) are known for their unrivalled accuracy, precision and reliability. WDXRF spectrometers have met the needs of many industrial applications, where robust instrumentation and high precision are the keys to success.
TheS8老虎Series 2顺序WDXRF为最苛刻的矿产和采矿应用提供了出色的出色分析性能。这种分析性能来自创新的优化X射线光学元件。S8 Tiger结合了极端的易用性和可靠的可靠性和出色的分析性能。
快速WDXRF光谱仪
快速WDXRF光谱仪for the Fastest Results!
新的S8 LIONWDXRF spectrometer provides the fastest time-to-result for process and quality control in the cement, minerals and mining industries.
基于多通道技术，S8 LION在提供非常精确和准确的结果the shortest measurement time, for up to 16 elements. Several languages are available for its interface: English, Spanish, Chinese, Russian and Portuguese.
台式能量分散性XRF
Benchtop Energy-Dispersive X-ray Fluorescence Spectrometers
具有能量分散性X射线荧光（EDXRF）光谱的元素分析已成为研究和行业的必不可少的工具。可靠的结果，分析灵活性，强大的多合一设计和低操作成本使得独特S2 PUMA系列2benchtop EDXRF the ideal solution for process and quality control applications; for example, cement, minerals and mining, and metals.
For dedicated analytical tasks, monitoring and field work in geology and exploration, theS2 PUMA系列2, equipped with the intuitive TouchControlTM interface, is the right choice to serve all needs for mobility, flexibility and ease-of-use in combination with best performance.
Handheld and Portable XRF
Handheld and Portable XRF
便携式和手持XRF允许对地球化学分析的投影更接近操作并进入现场。便携式X射线荧光（PXRF）光谱仪提供直接的元素分析，以支持地球化学映射，核心扫描和常规地球化学操作（例如等级控制）。布鲁克的专家可以帮助设计一个测量计划：
从矿山生命周期或商品价值链中的任何点快速提供关键任务的地球化学数据
Has appropriate sample preparation including pulping
Utilizes a matrix-matched calibration
包括强大的QA/QC协议，包括样本重复，空白和参考标准
Incorporates verification of at least 10% of results by complementary methods like WDXRF
Updates the calibration based on verification results and recalculates data to become more accurate with time
Total Reflection XRF
总反射X射线荧光光谱仪
总反射XRF（TXRF）是采矿中水性地球化学，粉末或消化岩石的新兴方法。可以在没有稀释的小样品上实现降至PPB范围的检测极限，没有消耗的气体和简单的样品制备。TXRF是用于测试重金属（如镉（CD），汞（HG）和硒（SE）等重金属的耗水，径流，土壤，土壤和其他废水的理想方法。例如，当浓度水平高于约30 µg/L时，可以在水中分析汞。布鲁克（Bruker）提供了两种TXRF型号：
S2 PICOFOXis a single excitation source 25 sample TXRF is just as at-home on-site as it is in the lab. Measure form aluminum (Al) to uranium (U)
S4 T-STARis a duel excitation source, high-throughput 90 sample TXRF for measurements from sodium (Na) to uranium (U), the ultimate tool for full coverage of the periodic table
Micro-XRF
微XRF样品的空间地球化学
核心，手工样品，RC钻头或沉积物样品的详细表征对于格林菲尔德和布朗菲尔德探索都是基础的。Micro-XRF是用于这种表征的新工具，可以赋予样品的高度准确的大区块地球化学映射，而无需进行密集样品制备。Bruker的Micro-XRF系列提供：
Visualization of the spatial distribution of geochemistry with relative abundance and quantified elemental maps from Na to U in theM4龙卷风and C to Am in theM4龙卷风加
快速快速筛选指标矿物质，计算晶粒尺度指标的计算
Targeted single-spot or line-scan bulk-rock quantification with spot size to 18 µm polycarpellary high-brilliance spot, or with optional 0.5 mm, 1 mm, 2 mm and 4.5 mm columnated x-ray source
Calculate bulk-rock geochemistry from maps including user-selected polygons
能够在扫描电子显微镜中添加微XRF功能Quantax Micro-XRF和矿物图M4龙卷风AMICS
学到更多
Publications Related to Geochemistry by XRF
相关产品
相关产品
Product |
Type |
样品 |
映射 |
Elemental Range |
|---|---|---|---|---|
Sequential WDXRF |
最多75个位置xy-autochanger |
300 µm or 1.25 mm spot |
Carbon to americium (C – Am) |
|
同时wdxrf |
Up to 12 position XY-autochanger |
300 µm or 1.25 mm spot |
Carbon to americium (C – Am) |
|
台式顺序WDXRF |
最多24个位置xy-autochanger |
N/A。 |
Carbon to americium (C – Am) |
|
台式EDXRF |
Up to 20 position XY Autochanger or 18 position carousel |
N/A。 |
Carbon to americium (C – Am) |
|
SEM的Micro-XRF，100 µm |
通过SEM变化 |
50 mm travel distance RapidStage™ |
Carbon to americium (C – Am) |
|
Benchtop Micro-XRF, ~18 µm spot polycarpellary; optional 0.5, 1, 2, 4.5 mm columnated |
Large chamber with X-Y mapping stage, optional core holder and thin section holder |
快速元素映射，映射面积为190毫米x 160毫米 |
铀钠（Na - U） |
|
Benchtop Micro-XRF, ~18 µm spot polycarpellary; optional 0.5, 1, 2, 4.5 mm columnated |
映射area of 190 mm X 160 mm, , optional core holder and thin section holder |
快速元素映射，映射面积为190毫米x 160毫米 |
Carbon to americium (C – Am) |
|
手持式EDXRF，开放横梁，8毫米斑点，5毫米可选 |
1个样本 |
N/A。 |
Magnesium to Uranium (Mg – U) |
|
手持式EDXRF，开放横梁，8毫米斑点尺寸 |
1个样本 |
N/A。 |
铁到铀（Fe - U） |
|
便携式EDXRF，安全互锁，8毫米斑点，5毫米可选 |
1个样本 |
N/A。 |
Magnesium to Uranium (Mg – U) |
|
Handheld XRF, open beam, 8 mm spot size |
1个样本 |
N/A。 |
Fluorine to Uranium (F-U) |
|
Portable Benchtop TXRF |
最多25个样品 |
N/A。 |
Aluminum to Uranium (Al – U) |
|
台式TXRF |
最多90个样品 |
N/A。 |
铀钠（Na - U） |