The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales. Supporting the most prominent testing modes, the TS Select is an affordable entry into quantitative nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and high-resolution mechanical property mapping.
Characterize the elastic modulus, hardness, creep, stress relaxation, and fracture toughness of localized microstructures, interfaces, small surface features, and thin films.
Utilizes the same probe to raster the sample surface for topography imaging as it does to conduct the nanomechanical test, ensuring superior nanomechanical characterization results, data reliability, and nanometer precision test placement accuracy.
提供高速测试功能,比传统的纳米构件测量快180倍。在每秒两次纳米引导测试中,可以在几分钟内获得不均匀材料的高分辨率机械性能图。必威手机客户端
可以根据应用的接触力,滑动速度和通过数量来测量定量磨损量和磨损率。由于测试的规模,可以很容易地测量单个微观结构,界面和薄膜的摩擦学性能。
Dynamic nanoindentation superimposes a small oscillatory force over a quasi-static force component to obtain a continuous measurement of hardness and modulus as a function of depth into a material’s surface. The dynamic nanoindentation option includes a capacitive transducer optimized for dynamic measurements and controller electronics to deliver superior results as a function of testing depth, frequency, and time.
NanosCratch利用静电驱动的二维传感器以受控的方式施加正常力,同时测量了横向穿过样品表面所需的力所需的力。NanosCratch选项不依赖于机动舞台进行横向运动,从而提供了市场上最敏感和可靠的纳米级摩擦和薄膜粘附测量值。
Bruker’s TS Select control and analysis software package was specifically developed to simplify the measurement process; from loading samples and test set-up to measurement execution and data analysis. TS Select control software incorporates automated sample testing and instrument calibration routines for simple, highthroughput, and mistake-free characterization.