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하이라이트

<20

µm

Spot size

Focused X-ray beam with polycapillary lens

1

小姐

Minimum dwell time per pixel

Mapping with stage speed up to 100 mm/s

12

Layers selectable

可以使用可选的Xmethod软件包分析多层系统

High Performance micro-XRF with Market-Leading Speed and Flexibility

M4龙卷风是山姆的工具选择ple characterization using small-spot micro X-ray fluorescence. Its measurements give information about composition and element distribution, even from below the surface. Bruker's micro-XRF spectrometer is optimized for high-speed analyses of points, lines and 2D area scans (element mapping) of any kind of sample; be it organic, inorganic or liquid.

主X射线激发使用多毛细管镜头，可提供小斑点尺寸和高X射线强度。M4龙卷风可与各种布鲁克Xflash配置^®silicon drift detectors (SDD), offering high throughput without compromising energy resolution.

M4龙卷风的出色配置选项之一是额外的X射线管，该X射线管提供了不同的目标材料和用于扩展分析功能的准直仪更换器。

进一步的最新配置选项：

在室内保持大气压力的同时，可以提高光线元素的性能
A quick-exchange stage and a geo-sample holder packaged for thin sections and drill cores
用于标准支持和完全标准的定量以及层厚度计算的Xmethod软件
Amics软件for automated mineral analysis

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혜택

How Can the M4 TORNADO Support Your Analyses?

Decrease measurement times.优化的X射线激发路径，高通量探测器，像素时间降至1 ms的“直接”映射。

测量最大7公斤的样品。Large vacuum chamber, freely adjustable, constant vacuum down to 2 mbar, automatic helium or nitrogen flush to protect your samples.

Map an area of up to 190 x 160 mm².记录高达40 mio。像素在一项运行中，数据存储为超图，并具有完整的光谱信息，每个像素的光学图像。

Quantify spectra, linescans and mappings.Configurable fundamental parameter method, optional XMethod software package for layer or standard-based quantification, layer analysis of mappings.

Process your data.Powerful software package, extraction of arbitrary object sum spectra (ellipses, rectangles, polygons), extraction of line scans, determination of elements present only at single measurement locations (MaximumPixelSpectrum), chemical phase analysis (Autophase).

扩展您的功能。从广泛的配置中获利以符合您的分析需求。