D8发现
Top performance in XRD
Najważniejsze informacje
D8 Discover是旗舰多功能X射线衍射仪，提供领先的技术组件。它设计用于从粉末，无定形和多晶材料到在环境和非镜子条件下外延多层薄膜的结构表征。必威手机客户端
应用程序：
- 相位识别和定量，结构确定和完善，微应变和晶体大小分析，
- X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis
- Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS),
- Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF), Small Angle X-Ray Scattering (SAXS)
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Cechy Charakterystyczne
主要特征
微聚焦源IµS
The IµS microfocus source equipped with MONTEL optics provides a small high intensity x-ray beam that is perfectly suited for the investigation of small areas or samples.
- 毫米大小的光束具有高光彩和超低背景
- 低功耗，没有用水和扩展寿命组件的绿色设计
- montel光学元件to optimize the beam shape and divergence
- Full compatibility with our large choice of components, optics and detectors.
UMC Sample stages
The D8 DISCOVER offers a multitude of UMC stages with unrivalled mapping and weight capacity:
- Mapping of samples with a weight of up to 5 kg
- Large area mapping of samples with up to 300 mm size.
- 高通量筛查（HTS）的UMC阶段，最多支持三个井层。
Due to the high modularity the UMC stages can be customized to match customer requirements that go beyond the standard configurations.
Multimode EIGER2 R Detectors
The EIGER2 R 250K and 500K are the 2D detectors that bring Synchrotron performance to laboratory X-Ray Diffraction
- Advanced Sensor Design including the 2nd generation of the revolutionary EIGER: up to 500.000 pixels with size of 75 x 75 mm² allow for Macroscopic Coverage with Microscopic Resolution.
- Its ergonomic design allows to adapt detector position and orientation with least effort to the application requirements. This includes toolless switch between 0°/90° orientation and a continuously variable detector position with automated calibration.
- Panoramic Optics and Accessories for unobstructed field of view.
- 0D, 1D and 2D operation mode with Snap-Shot, Step, Continuous or Advanced Scanning modes.
- Complete and seamless integration into the DIFFRAC.SUITE.
TRIO and PATHFINDER PLUS Optics
The patented TRIO optics enables automated switching between three beampaths:
- Focusing Bragg-Brentano for powders
- High intensity parallel beam Kα1,2 for capillary, GID and XRR
- High-resolution parallel-beam Kα1 geometry for epitaxial thin films
The PATHFINDERPlus视觉包括一个自动吸收器,以确保林earity of the measured intensities and allows to switch between:
- Motorized slit for high flux measurements
- Analyzer crystal for high resolution measurements
Equipped with TRIO and PATHFINDERPlusthe D8 DISCOVER masters all sample types including powder, bulk, fiber, sheet and thin-film (amorphous, polycrystalline and epitaxial) under ambient or non-ambient conditions without any need of reconfiguration.
Aplikacje
Premium Class X-ray Diffraction
Thin Film Analysis
X-Ray Diffraction (XRD) and reflection play a dominant role in the non-destructive characterization of thin layer structured samples. The D8 DISCOVER and DIFFRAC.SUITE software support simple execution of common XRD methods in thin film analysis:
- Grazing Incidence Diffraction (GID) for Surface sensitive Identification of crystalline phases and determination of their structural properties including crystallite size and strain.
- X-ray reflectometry (XRR) for the extraction of thicknesses, material densities and interface structures in multi-layer samples – from simple substrates to highly complex superlattice structures.
- 高分辨率x射线衍射(HRXRD)analysis of epitaxial grown sample structures: Layer thickness, Strain, relaxation, mosaicity, composition analysis of mixed crystals.
- 压力和质地（首选方向）分析
Materials Research
XRD is one of the most important tools in materials research as it allows linking of structural and physical properties of materials. The D8 DISCOVER is the flagship XRD instrument for materials research. Equipped with leading technology components the D8 DISCOVER delivers top performance and full flexibility and enables researchers for a detailed characterization of their materials:
- Phase Identification and structure determination
- Micron strain and crystallite size analysis
- 压力和质地分析
- Determination of Particle size and distribution.
- 局部XRD分析使用µM大小的X射线梁
- Reciprocal Space Mapping
筛选和大面积映射
D8发现是高通量筛选（HTS）和样品上大面积的映射时的最终解决方案。UMC样本阶段提供了一系列运动，使D8在电动翻译和重量容量中均以自己的一类发现：
- Hight Throughput Screening (HTS) of well plate and deposited samples in both reflection and transmission
- Mapping of samples with a size of up to 300 mm
- Mounting and mapping samples with weights up to 5 kg
- Automation interfacing
Application Gallery
Specyfikacje
D8发现Specifications
| Specification | Benefit | |
| TWIST-TUBE | Easy switch between point and line focus 可用阳极：CR，CU，MO，AG 最大限度。Power and filament: up to 3 kW depending on anode material (0,4 x 16 mm² ) Patent: EP 1 923 900 B1 |
Quick change of the wavelength to perfectly match different applications Fastest switch between line and point focus for a wider range of applications and better results in shorter time |
| IµS Microfocus Source | Power load: up to 50 W, single-phase power MONTEL and MONTEL Plus optics combining parallel and focusing mirrors. Beam sizes down to 180 x 180 µm². 镜面出口处的最大集成通量8 x10⁸cps。 Beam divergence down to 0,5 mrad |
毫米大小的光束具有高光彩和超低背景 低功耗，没有用水和扩展寿命组件的绿色设计 优化梁的形状和发散以获得最佳结果 |
| Turbo X-Ray Source (TXS) | Line focus, 0.3x3 mm² Focal brigthness of 6 kW/mm² Anode materials: Cu, Co, Cr, Mo 最大限度。voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW Pre-Aligned Tungsten filament |
Up to 5 times more intensity compared to standard ceramic X-ray sources. Perfectly suited for line and spot focus applications Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement. |
| 三重奏光学 | Software push-button switch between: 电动发散缝隙（Bragg-Brentano） High Intensity Ka1,2 Parallel Beam 高分辨率KA1平行梁 Patents: US10429326, US6665372, US7983389 |
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial) |
| High-Resolution Monochromators | Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry 2-bounce and 4-bounce (Bartels type) monochromators Alignment-free mounting through SNAP.LOCK technology |
Broad choice for best resolution vs. intensity balancing to obtain best possible results. Fast exchange of monochromators to optimize to different samples |
| D8 Goniometer | Two-circle goniometer with independent stepper motors and optical encoders | Unparalleled accuracy and precision as manifasted by Bruker's unique alignment guarantee Absolutely maintenance free drive mechanism / gearings with lifetime lubrication |
| UMC Stages | Family of sample stages x，y，用于最多+/- 150毫米的样品翻译 z-Drive with travel of up to 50 mm Phi drive with infinite rotation 最大限度。Psi inclination up to 55° 最大限度。weight (at center position) : 50 kg |
样本重量和大小无与伦比的容量 Enables the implementation of large custom-made sample chambers |
| Centric Eulerian Cradle (CEC) | Five degrees of freedom sample stage: x,y for sample translation of +/-40 mm Z-drive进行高度对齐 Phi drive with 360° rotation Psi drive and angular range from -11° to 98° 最大限度。重量负载：1公斤 Various stage attachment avaible. |
Stress and Texture measurements in side-inclination for higher accuracy results. Automated mapping capability in (x,y). Motorized tilt-stage for precise surface alignment. 粉末或毛细血管旋转器允许粉末衍射。 刺刀样本阶段持有人，用于与其他阶段的快速交换。 |
| Pathfinder Plus Optics | Software push-button switch between: Motorized Slit 2-bounce Ge Analyzer Automated absorber integrated |
Fully automatic, motorized switching between two different optics without any manual user intervention. 保持Lynxeye探测器的完整视野。 Absorber ensures linearity in measured data |
| LYNXEYE XE-T | Energy Resolution: < 380 eV @ 8 KeV Detection Modes: 0D,1D, 2D 波长：CR，CO，CU，MO和AG Patents: EP1647840, EP1510811, US20200033275 |
No need for Kß filters and secondary monochromators 100% filtering of Fe-fluorescense with Cu radiation Up to 450 times faster than conventional detector systems bragg2d：用不同的主线梁收集2D数据 Unique detector warranty: No defective channels at delivery time |
| EIGER2 | The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd. | Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage Panoramic, tool-free diffracted beam optics using the complete detector field of view Continuously variable detector positioning to balance angular coverage and resolution |
| Non-ambient | Temperature: Ranging from ~12 K up to ~2500 K Pressure: 10-⁴ mbar up to 100 bar Humidity: 5% to 95% RH |
Investigations under ambient and non-ambient conditions Easily exchanged stages with DIFFRAC.DAVINCI |
Akcesoria
XRD Components
布鲁克XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.
All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.
布鲁克XRD components are available for upgrading the installed X-ray systems for improving their performance.
Oprogramowanie
Webinary
Webinars
więcejInformacji
D8发现Resources
Application Notes & Reports & Product Sheets
- Rapid XRD Analysis of Pharmaceuticals: Snapshot 1D and 2D Mode with the EIGER2 R 500K
- 带有Eiger2 R 500K的大区域RSM：INXGA1-XN LED，GAAS和SI1-XGEX外延膜的分析
- μXRD in Geology with EIGER2 R 500K: In-Situ Study of Lazulite from Graves Mountain, Georgia, USA
- Residual Stress with EIGER2 R 500K: 0D, 1D, and 2D investigation of a polycrystalline tungsten coating on silicon
- Texture Analysis with EIGER2 R 500K and DIFFRAC.TEXTURE: Investigation of Rolled and Drawn Aluminum Sheets
- D8发现with IμS, μXRD Phase mapping
- D8使用IμS微聚焦源发现，面内放牧发病率衍射（IP-GID）
- D8发现with IμSHigh Brilliance Microfocus Source, X-Ray Reflectometry
- D8发现with IμSHigh Brilliance Microfocus Source, Powder Diffraction
- D8发现with PILATUS3 R 100K-A, 2D RSM of Thin Films
- D8发现with PILATUS3 R 100K-A, 2D GI-SAXS
- D8使用Pilatus3 R 100K-A，石英蒙脱石的微XRD2
- D8发现with PILATUS3 R 100K-A, XRD2 of Polymers
- D8发现with PILATUS3 R 100K-A, Texture Analysis with XRD2
- D8发现PILATUS3 R 100 k,剩余度假s Analysis with XRD2
- Universal Motion Concept and Eulerian Cradles for Controlled Sample Positioning
- EIGER2 R for the D8 Family
Wsparcie
Service & Support
We provide:
- 高技能故障排除专业人员的帮助办公桌支持，隔离和解决硬性和软件问题
- Web-based remote instrument service for service diagnosis and applications support
- Merged reality support – a virtual engineer at your side (video）
- Planned maintenance, according to your requirement
- Customer on-site repair and maintenance service
- Spare parts availability typically over night or within a few working days worldwide
- Compliance services for installation qualification, operational qualification / performance verification
- Site planning and relocation
- Find your nexttraining course
Check out oursupport websitefor:
- Software updates
- Product manuals & installation guides
- Training videos
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