Dimension HPI
Highlights
Dimension HPI
Dimension HPI系统专门为大容量，生产环境而设计，可实现许多AFM模式的自动测量，同时确保最大程度的使用性和每次测量的最低成本，以进行质量控制，质量保证和故障分析。使用触点，窃听和峰值敲击模式技术，尺寸HPI使用户能够精确地控制探针到样本的交互，从而提供长时间的寿命时，可实现数千次测量。
Eigenschaften
最宽的测量范围
从独家峰值攻击模式到传统的AFM模式，HPI的Dimension提供了最大的范围和灵活性，可满足特定的制造计量需求，这些样品范围广泛，而没有通常与AFM研究设置相关的复杂性。
Fast Nanoelectrical Metrology
FastScan technology with Conductive-AFM (CAFM) can perform nanoscale current measurements at high scan rates, significantly increasing the efficiency of failure analysis measurements. Using a small magnetic force microscopy (MFM) cantilever, FastScan HPI provides greater than 10x scan rate improvements for MFM applications with exceptional data quality using PeakForce Tapping. PeakForce KPFM™ provides the highest spatial resolution and most accurate measurements of surface potential. PeakForce TUNA™ provides the most sensitive conductivity measurements.
精确的纳米力学映射
布鲁克’s unique PeakForce QNM and FastForce Volume™ nanoscale mechanical mapping modes can precisely map mechanical properties—modulus, stiffness, adhesion, dissipation, and deformation— while simultaneously imaging sample topography and electrical properties. PeakForce QNM enables non-destructive measurements on polymers, thin films, and nanoscale defects not measurable by transmission electron or scanning electron microcopy techniques.