Dimension HPI
하이라이트
Dimension HPI
Designed specifically for high-volume, production environments, the Dimension HPI system enables automated measurements of many AFM modes while ensuring the utmost ease of use and the lowest cost per measurement for quality control, quality assurance, and failure analysis. Using contact, tapping, and PeakForce Tapping mode techniques, Dimension HPI enables users to precisely control probe-to-sample interaction, providing long tip life-times with high-accuracy results in thousands of measurements.
특징
最宽的测量范围
从独家PeakForce开发模式到交付nal AFM modes, Dimension HPI provides the greatest range and flexibility to meet specific manufacturing metrology needs on a wide range of samples, without the complexity usually associated with AFM research setups.
Fast Nanoelectrical Metrology
FastScan technology with Conductive-AFM (CAFM) can perform nanoscale current measurements at high scan rates, significantly increasing the efficiency of failure analysis measurements. Using a small magnetic force microscopy (MFM) cantilever, FastScan HPI provides greater than 10x scan rate improvements for MFM applications with exceptional data quality using PeakForce Tapping. PeakForce KPFM™ provides the highest spatial resolution and most accurate measurements of surface potential. PeakForce TUNA™ provides the most sensitive conductivity measurements.
精确的纳米力学映射
Bruker独特的Peakforce QNM和FastForce Volume™纳米级机械映射模式可以精确地映射机械性能 - 模型，刚度，粘附，粘连，耗散和变形 - 同时对样品的超图像和电气性能同时进行想象。PeakForce QNM可以对聚合物，薄膜和纳米级缺陷进行无损测量，而无法通过透射电子或扫描电子微拷贝技术测量。