维度HPI
Punti salienti
维度HPI
Designed specifically for high-volume, production environments, the Dimension HPI system enables automated measurements of many AFM modes while ensuring the utmost ease of use and the lowest cost per measurement for quality control, quality assurance, and failure analysis. Using contact, tapping, and PeakForce Tapping mode techniques, Dimension HPI enables users to precisely control probe-to-sample interaction, providing long tip life-times with high-accuracy results in thousands of measurements.
Caratteristiche
Widest Range of Measurements
From exclusive PeakForce Tapping modes to traditional AFM modes, Dimension HPI provides the greatest range and flexibility to meet specific manufacturing metrology needs on a wide range of samples, without the complexity usually associated with AFM research setups.
快速纳米电量学
具有导电AFM（CAFM）的快速扫描技术可以以高扫描速率执行纳米级电流测量值，从而显着提高了故障分析测量的效率。FastScan HPI使用较小的磁力显微镜（MFM）悬臂，为MFM应用提供了超过10倍的扫描速率，并使用峰值攻击具有出色的数据质量。PeakForce KPFM™提供了最高的空间分辨率和最准确的表面电势测量值。PeakForce Tuna™提供了最敏感的电导率测量值。
精确的纳米机械制图
布鲁克’s unique PeakForce QNM and FastForce Volume™ nanoscale mechanical mapping modes can precisely map mechanical properties—modulus, stiffness, adhesion, dissipation, and deformation— while simultaneously imaging sample topography and electrical properties. PeakForce QNM enables non-destructive measurements on polymers, thin films, and nanoscale defects not measurable by transmission electron or scanning electron microcopy techniques.