Dimension HPI
Lo más destacado
Dimension HPI
Dimension HPI系统专门为大容量，生产环境而设计，可实现许多AFM模式的自动测量，同时确保最大程度的使用性以及每次测量的最低成本，以进行质量控制，质量保证和故障分析。使用触点，窃听和峰值敲击模式技术，尺寸HPI使用户能够精确控制探针到样本相互作用，从而提供长时间的寿命时，可实现数千次测量。
Características
最宽的测量范围
从独家峰值攻击模式到传统的AFM模式，HPI的Dimension提供了最大的范围和灵活性，以满足广泛样本的特定制造计量需求，而没有通常与AFM研究设置相关的复杂性。
Fast Nanoelectrical Metrology
FastScan technology with Conductive-AFM (CAFM) can perform nanoscale current measurements at high scan rates, significantly increasing the efficiency of failure analysis measurements. Using a small magnetic force microscopy (MFM) cantilever, FastScan HPI provides greater than 10x scan rate improvements for MFM applications with exceptional data quality using PeakForce Tapping. PeakForce KPFM™ provides the highest spatial resolution and most accurate measurements of surface potential. PeakForce TUNA™ provides the most sensitive conductivity measurements.
精确的纳米力学映射
布鲁克’s unique PeakForce QNM and FastForce Volume™ nanoscale mechanical mapping modes can precisely map mechanical properties—modulus, stiffness, adhesion, dissipation, and deformation— while simultaneously imaging sample topography and electrical properties. PeakForce QNM enables non-destructive measurements on polymers, thin films, and nanoscale defects not measurable by transmission electron or scanning electron microcopy techniques.
由纳米镜6 AFM控制器提供动力
Featuring higher speeds, lower noise, and greater AFM mode flexibility, the NanoScope 6 controller allows users to harness the full potential of our high-performance Dimension and MultiMode AFM systems. This latest generation controller provides unprecedented accuracy, precision, and versatility for nanoscale surface measurements in every application.
NanoScope 6 uniquely enables Bruker AFMs to:
- Operate in more imaging modes than is possible with competing systems, including unique and advanced AFM modes that require complex control and analysis;
- Collect accurate, quantitative data for nanoelectrical and nanomechanical property measurements in every application; and
- 优化和自定义扫描参数，即使满足最苛刻的研究和行业测量要求。
