维度HPI
伪造的侯爵夫人
维度HPI
Designed specifically for high-volume, production environments, the Dimension HPI system enables automated measurements of many AFM modes while ensuring the utmost ease of use and the lowest cost per measurement for quality control, quality assurance, and failure analysis. Using contact, tapping, and PeakForce Tapping mode techniques, Dimension HPI enables users to precisely control probe-to-sample interaction, providing long tip life-times with high-accuracy results in thousands of measurements.
的特性
最宽的测量范围
From exclusive PeakForce Tapping modes to traditional AFM modes, Dimension HPI provides the greatest range and flexibility to meet specific manufacturing metrology needs on a wide range of samples, without the complexity usually associated with AFM research setups.
快速纳米电量学
具有导电AFM（CAFM）的快速安全技术可以以高扫描速率执行纳米级电流测量值，从而显着提高故障分析测量的效率。FastScan HPI使用较小的磁力显微镜（MFM）悬臂，为MFM应用提供了超过10倍的扫描速率，并使用峰值攻击具有出色的数据质量。PeakForce KPFM™提供了最高的空间分辨率和最准确的表面电势测量值。PeakForce Tuna™提供了最敏感的电导率测量。
Precise Nanomechanical Mapping
Bruker独特的Peakforce QNM和FastForce Volume™纳米级机械映射模式可以精确地映射机械性能 - 模型，刚度，粘附，粘连，耗散和变形 - 同时对样品的超图像和电气性能同时进行想象。PeakForce QNM可以对聚合物，薄膜和纳米级缺陷进行无损测量，而无法通过透射电子或扫描电子微拷贝技术测量。