XFlash 6T-60

The medium active area 60 mm²chip mounted in a slim-line detector finger provides a large solid angle and high take-off angle.The XFlash^®6T-60 is therefore ideal for applications with relatively low X-ray yield, for instance for atomic resolution spectrometry, experiments where a zone axis must be kept and the sample cannot be tilted, and for beam-sensitive specimens(e.g. graphene, life science). The detector also delivers very good energy resolution with 126 eV at Mn Kα.

In summary, the XFlash^®6T-60 offers the following advantages:

• 良好的能量分辨率(126 eV Mn Kα,51 eVC Kα and 60 eV at F Kα available)
• Other available resolution is 129 eV at Mn Kα
• Extremely high pulse load capability
• Excellent light element and low energy performance (element range Be - Am)
• Welded bellows as standard
• No vibration-generating cooling systems
• Immediately available after power on
• Maintenance-free operation
• Low operating cost
• Small dimensions, including slim-line technology finger
• Low weight
• Windowless version available on request

Suggested areas of application for the XFlash^®6T-60 are:

• Low X-ray yield applications on TEM and STEM, including aberration corrected electron microscopy