M4 TORNADO PLUS

Najważniejsze informacje

Carbon

最低可检测的元素

All elements starting from carbon can be measured

> 6

毫米

Depth of focus with AMS

The aperture management system (AMS) allows a sharp image on topographic samples

0.5-4.5

毫米

可选的准仪尺寸

附加管上的四位置准直仪调节器

The Revolutionary Super-Light Element micro-XRF Scanner

With the newest model of Bruker's micro-XRF family, you can find out more about your sample than XRF ever showed you before.

M4 Tornado Plus凭借其超光元件探测器，是第一个能够从碳上测量任何元件的微型XRF扫描仪。此外，所有光元素的性能都大大提高。

On this instrument, Bruker introduced the patented aperture management system (AMS) that enhances the depth of focus of the polycapillary lens for sharper element mappings of uneven samples. The optional second X-ray source further extends the analytical capabilities with its four selectable spot sizes from 0.5 to 4.5 mm.

更轻，更快，更深。

The chamber of the M4 TORNADO family offers an option for He-flush. This increases the light-element performance while maintaining atmospheric pressure in the chamber. Light elements in biological or wet specimens can be analyzed without the need to freeze or dry the samples.

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M4 Tornado Plus：超光元件微XRF光谱仪

Korzyści

Benefit from the PLUS in Analytical Performance

Measure solids, particles or liquids with all advantages the well-proven M4 TORNADO family has to offer
扩展您的Micro-XRF体验，具有记录光谱，线扫描和整个元素范围的地图的能力。
记录并保存每个像素的光学图像和完整光谱信息的组合在超图数据立方体中
Reduce your measurement time through the combination of the focused X-ray beam with two high-throughput super-light element SD detectors
Get fast quantification results with a configurable fundamental parameter routine or use Bruker's XMethod software for standard-supported, fully standard-based and layer thickness quantification
使用光圈管理系统地图在高度焦点处地图不均匀样本（AMS)
Improve performance with upgrades and service packages throughout the whole lifetime of the instrument