Micro-XRF Spectrometers

M6 JETSTREAM

Large Area micro-XRF Scanner in High Definition

移动元素分析

超快速映射

布鲁克M6 JETSTREAM µ-XRF spectrometer, Large Area macro XRF Scanner in High Definition

命运

2x60
mm²
SDD size
Dual silicon drift detector option for fastest acquisition
80x60
cm²
Scannable surface
Mapping larger samples in one run
100-500
µm
Adjustable spot size
The spot size can be adjusted in five steps to match the structure of the sample

State of the Art in Large Area micro-XRF

大型样品(也称为Macro-XRF或MA-XRF)上的Micro-XRF已成为分析绘画,地质样本,考古文物和工业组件的决定性方法。必威东盟体育M6播程将这些分析驱动到最高速度和准确性。借助其移动轴距和可调节的框架,M6 Jetstream可以在现场使用,而不是将样品运输到实验室。

  • 测量直立样品或水平表面
  • Scannable area up to 800 x 600 mm²
  • "On the fly" analysis for highest mapping speed
  • 可调节的点大小以匹配样品的结构
  • XFlash® SDD technology with up to 2 x 60 mm² detector area
  • Optional aperture management system (AMS) to gain depth of focus on uneven surfaces

Benefícios

What Can You Expect from the M6 JETSTREAM?

Micro-XRF Study of the Troodontid Dinosaur Jianianhualong Tengi Reveals New Biological and Taphonomical Signals, Jinhua Li et. al, Atomic Spectroscopy 2021 42(1)
  • Get spatially resolved information about the elemental distribution of almost any surface
  • Record data over large areas in one run
  • 结合高分辨率光学images with a full spectrum per pixel in one HyperMap dataset
  • Process data and extract object spectra , line scans and chemical phases from maps
  • Quantify spectra using standardless Fundamental Parameter (FP) methods
  • Reduce cost and time by avoiding logistics and ensuring security of valuable objects
Discover the broad range of mico-XRF samples

Especificacoes

技术细节

最多100毫米/s级速度 Mapping can be conducted "on the fly" with dwell times down to 1 ms per pixel


30mm² or 60mm² SDDs with ≤145 eV The M6 JETSTREAM can be equipped with different Bruker XFlash® detectors, all specified with ≤145 eV at Mn Kα

±10° tilt in vertical measurement mode In addition to the 90° tilt between horizontal and vertical measurement, the rig can be tilted in fine steps to adjust to inclined surfaces