QUANTAX Micro-XRF

The new Rapid Stage is specifically designed for SEMs to enable large area mapping over millimeter (mm) to centimeter (cm) scales. This will eliminate potential SEM X-ray intensity variation artifacts associated with low magnification mapping and thus enhance elemental and mineralogical information in a timeous manor that was previously not possible.

The ability to observe elemental changes within samples is important to understand geological processes and ore deposit genesis. The dual source system which incorporates a micro-XRF on a SEM enables elemental X-ray mapping over large areas, which shows major, minor and also trace elements on the ppm scale.

The combination of micro-XRF with SEM enables the potential to analyze samples at multiple scales, from centimeters (cm) to millimeters (mm) to micrometers (µm) and below within a solitary system. Thus, by adding the micro-XRF to an SEM you convert your SEM to a dual source system, meaning that there are 2 excitations sources, the e-beam and photon beam. Either source can be used individually, or simultaneously, to generate sample X-rays that will be measured using the same EDS detector.

提出了一种地图地幔garne SEM-XRF元素t-spinel peridotite from the diamond-bearing Newlands kimberlite (South Africa, Kaapvaal Craton). The intensity of the various elements indicates certain minerals that are present in the sample.

守护神ge Area Mapping (Hypermaps) using SEM-XRF can be performed on samples with topography. That is, minimal sample preparation is required and the sample can be analyzed directly without any degredation. This is particularly relevant in the analysis of soils, where any form of sample preparation, such as mounting and polishing or carbon coating, may alter the specimen.

As X-rays may pass through matter, X-ray Fluorescence (XRF) allows the determination of layer thickness. Using micro-XRF on SEM, the layer analysis (thickness and composition) is rendered feasible with spatial resolution at the micrometer scale. Layer analysis is strongly based on quantification using atomic fundamental parameter (FP).