Exploration for oil and gas requires intense scientific investigation to identify accumulations and de-risk exploration and production. New tools are required for the investigation of petroleum system elements in the era of ultra-deep wells, unconventional oil and gas, subsalt exploration, and frontier exploration in extreme environments. Bruker’s tools for reservoir characterization and chemostratigraphy include the ability to visualize and characterize the composition of rocks at scales from the basin to the pore.
Chemostratigraphy is the use of variations in the chemical composition of sedimentary successions to:
understand correlative relationships at the basin or field scale
identify elemental proxies used in paleoecological reconstructions
aid in building sequence stratigraphic frameworks
identify physical properties of rocks for drilling and compilations
Bruker provides tools for the elemental and chemical analysis of core and cuttings to make chemostratigraphy easy and scalable. Click below to learn more about applying chemostratigraphy to any sized project.
Elemental Analysis is an important tool for the field and petroleum geologist to characterize and identify petroleum- or gas-bearing formations. Drill cuttings, mud, or cores can be analyzed by X-ray Fluorescence (XRF).
The benchtopS2 PUMASeries 2 reaches low detection limits on prepared drill cuttings in a mobile lab by using the Energy Dispersive XRF (EDXRF).
The analysis of majors and traces in the lab is best performed by the floor standingS8老虎Series 2 Wavelength Dispersive XRF (WDXRF) spectrometer using either the GEO-QUANT package or custom calibrations.
TheCTXis a compact portable countertop XRF ideal for rig operations, with a battery backup, push-button operation, spill-proof rugged aluminum case, and safety-interlocked lid. Now available with the MUDROCK matrix-matched calibration, the versatile GeoEXPLORATION calibration, or a custom calibration.
TheTRACER 5gis the ideal portable XRF for core, outcrop, or cuttings. With a helium flush and graphene window it has the best light element performance in a handheld. When paired with the MUDROCK calibration or a custom matrix-matched formation-specific calibration it is the most trusted portable XRF in oil and gas.
Additional information on the mineralogical composition of the sediment or formation is offered by X-ray Diffraction (XRD). XRD distinguishes minerals that have the same or similar chemistry by their crystal structures. It not only allows the identification of minerals withDIFFRAC.EVA, but also offers standardless quantification using the Rietveld approach. Even non-crystalline phases may be quantified using this method. It enables pinpointing of potential reservoirs and host formations. A major advantage is the rather simple and quick sample preparation. The analysis of drill cuts can be done in a mobile lab using BRUKER’s benchtopD2移动器. In a lab setting, theD8努力or theD8 ADVANCEis the optimal choice.
储层表征模型结合岩石characteristics related to the storage and production of hydrocarbons. Bruker’s innovative rock characterization tools can provide new types of information in sedimentary rocks:
Visual geochemistry of sedimentary rocks, including visualizations of elemental and molecular distributions
Maps of minerals on scales from microns to nanometers including the ability to combine methods to translate 2D data to 3D data
在两个和三个维度中的毛孔和渗透性的可视化和表征,包括页岩中的纳米孔孔和砂岩中复杂的孔网络
以下是用于储层表征的方法的摘要。与布鲁克的石油和天然气专家联系,讨论任何分析需求和最佳解决方案。
Understanding porosity and permeability is important for oil and gas reservoir characterization, sedimentology, hydrogeology and groundwater studies. XRM enables characterization and visualization of pores, pore size distribution, and of open versus closed pore networks. This information can have profound implications on oil and gas production models, gas or water flooding, analog studies, contaminate flow modeling, deformation experiments and sedimentary petrology.
页岩反应性的分析通常涉及多种分析技术,包括但不限于X射线衍射,X射线荧光,伽马记录,光学显微镜,电子显微镜,总有机含量和阳离子交换能力。从矿物学的角度来看,XRD被广泛认为是最受欢迎的技术,特别是对于基本相似阶段的歧视。
例如,赤铁矿(Fe2O3)和辅助石(FECO3)给出了类似的元素签名,但具有明显的衍射模式。通常,对于井孔的垂直和水平段,经常获得衍射数据。垂直部分的分析允许鉴定具有理想物理特性的区域。在非常规储层的水平片段中,XRD主要用于地理座,以确保井眼留在特定的地质床中。
Method | 表征目标 | Sample Preparation |
---|---|---|
台式Micro-XRF | Map texture, composition and sedimentary structures with major and trace elements down to 18 µm | Slightly rough to flat surfaces, standard thin sections, billets, core plugs, core slabs, cuttings scatter mounts. |
XRM / X-ray Microscope | 结构和孔隙率的三维映射 | Core plugs, rock fragments |
Raman Microscopes | Molecular structures with Raman scattering phenomenon for organic matter analysis, thermal maturity, and fluid inclusion analysis. | Standard thin sections, cuttings, core plugs. |
FTIR Microscopes | C-H-O functional groups including organic matter analysis, mineral identification, and hydrocarbon analysis | 抛光和光滑的表面,薄部分,核心,插条 |
EDS on Scanning Electron Microscope (SEM) | Microanalysis of pores and textures for detailed characterization major and some trace elements | 抛光和涂层薄部分或SEM安装座。需要真空。 |
自动矿物学 | Combines BSE and EDS for high-speed large-area mineral maps to characterize texture, porosity, mineral associations, calculated physical properties (young’s modulus), and generate targeting for LA-ICP-MS of zircons | 抛光和涂层薄部分或SEM安装座。需要真空。 |
micro-XRF for Scanning Electron Microscope (SEM) | Improve trace-element performance in a scanning electron microscope with a 100 µm X-ray spot, particularly important for environmental proxies such as U and Mo. | 抛光和涂层薄部分或SEM安装座。需要真空。 |
透射电子显微镜(TEM)的EDS | Major elements and some trace elements with the best resolution. | 专门的TEM板层样品制备。 |
Nano-indentation | Benchtop or SEM-mounted hardness testing used to calculate Young’s modulus and other physical parameters | 抛光和涂层薄部分或SEM安装座。Vacuum sometimes required. |
Atomic Force Microscopy | An emerging tool for surface characterization at near-atomic scales may be used for identification and characterization of solid organic matter | Polished thin section or mount, vacuum not required |
EBSD/TKD | Detailed mineral maps and crystal orientation studies. | 高度抛光的薄片和电子透明样品 |
X-ray Diffraction |
晶体学期识别和定量 | Ground powders and flat surfaces |